DSCC 96588F:2023
Current
Current
The latest, up-to-date edition.
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, OCTAL TRANSPARENT LATCH WITH THREE STATE OUTPUTS, MONOLITHIC SILICON
Published date
24-10-2023
Publisher
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This drawing documents two product assurance class levels consisting of high reliability (device classes Q) and space application (device class V).
| DocumentType |
Standard
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| PublisherName |
Defense Supply Centre Columbus
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| Status |
Current
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| ASTM F 1192 : 2011 : R2018 | Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices |
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