DSCC 96877E:2025
Current
Current
The latest, up-to-date edition.
MICROCIRCUIT, MEMORY, DIGITAL, RADIATION-HARDENED, CMOS, 128K x 8 STATIC RAM, MONOLITHIC SILICON
Published date
20-03-2025
Publisher
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This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V).
| DocumentType |
Standard
|
| PublisherName |
Defense Supply Centre Columbus
|
| Status |
Current
|
| MIL-STD-883 Revision K:2016 | Microcircuits |
| ASTM F 1192 : 2024 | Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices |
| JEDEC JESD 78E:2016 | IC LATCH-UP TEST |
Summarise
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