DSCC 98537J:2026
Current
Current
The latest, up-to-date edition.
MICROCIRCUIT, MEMORY, DIGITAL, RADIATION HARDENED, CMOS/SOI, 128K X 8 STATIC RAM, MONOLITHIC SILICON
Published date
05-01-2026
Publisher
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This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V).
| DocumentType |
Revision
|
| PublisherName |
Defense Supply Centre Columbus
|
| Status |
Current
|
| Supersedes |
| MIL-STD-1835 Revision C:2000 | Electronic Component Case Outlines |
| MIL-HDBK-780 Revision C:1997 | Standard Microcircuit Drawings |
| ASTM F 1192 : 2024 | Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices |
| MIL-PRF-38535 Revision J:2010 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
Summarise
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