DSCC 99560H:2022
Current
Current
The latest, up-to-date edition.
MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED DUAL NON-INVERTING MOSFET DRIVER, MONOLITHIC SILICON
Published date
15-12-2022
Publisher
Sorry this product is not available in your region.
This drawing documents three product assurance class levels consisting of high reliability (device class Q), space
application (device class V) and for appropriate satellite and similar applications (device class T).
DocumentType |
Standard
|
ProductNote |
This standard also refers to EIA/JEDEC 51-7,JEDEC PUB 95.
|
PublisherName |
Defense Supply Centre Columbus
|
Status |
Current
|
MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
MIL-HDBK-103 Revision AW:2016 | LIST OF STANDARD MICROCIRCUIT DRAWINGS |
ASTM F 1192 : 2011 | Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices |
MIL-HDBK-780 Revision D:2004 | STANDARD MICROCIRCUIT DRAWINGS |
MIL-PRF-38535 Revision K:2013 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
MIL-STD-1835 Revision D:2004 | ELECTRONIC COMPONENT CASE OUTLINES |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.