MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED DUAL NON-INVERTING MOSFET DRIVER, MONOLITHIC SILICON

Published date

15-12-2022

Publisher

This drawing documents three product assurance class levels consisting of high reliability (device class Q), space
application (device class V) and for appropriate satellite and similar applications (device class T).

DocumentType	Standard
ProductNote	This standard also refers to EIA/JEDEC 51-7,JEDEC PUB 95.
PublisherName	Defense Supply Centre Columbus
Status	Current

MIL-STD-883 Revision K:2016	TEST METHOD STANDARD - MICROCIRCUITS
MIL-HDBK-103 Revision AW:2016	LIST OF STANDARD MICROCIRCUIT DRAWINGS
ASTM F 1192 : 2011	Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
MIL-HDBK-780 Revision D:2004	STANDARD MICROCIRCUIT DRAWINGS
MIL-PRF-38535 Revision K:2013	Integrated Circuits (Microcircuits) Manufacturing, General Specification for
MIL-STD-1835 Revision D:2004	ELECTRONIC COMPONENT CASE OUTLINES

View more information

Sorry this product is not available in your region.

Access your standards online with a subscription

Features

Simple online access to standards, technical information and regulations.
Critical updates of standards and customisable alerts and notifications.
Multi-user online standards collection: secure, flexible and cost effective.

Get in touch with us

DSCC 99560H:2022

MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED DUAL NON-INVERTING MOSFET DRIVER, MONOLITHIC SILICON

Abstract

General Product Information

Standards Referencing This Book

Category

Subcategory