• There are no items in your cart

DSCC V62/22612:2022

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by
superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

MICROCIRCUIT, BiCMOS, ULTRA-LOW-NOISE JESD204B DUAL-LOOP CLOCK JITTER CLEANER, MONOLITHIC SILICON

Superseded date

03-08-2023

Published date

05-12-2022

This drawing documents the general requirements of a high performance space grade Ultra-Low-Noise JESD204B Dual-Loop clock jitter cleaner microcircuit, with an operating temperature range of -55C to +125C.

DocumentType
Standard
ProductNote
This standard is also refers to JESD22-C101,JEDEC PUB 95.
PublisherName
Defense Supply Centre Columbus
Status
Superseded
SupersededBy

JEDEC JEP157A:2022 RECOMMENDED ESD-CDM TARGET LEVELS
MIL-STD-883 Revision K:2016 TEST METHOD STANDARD - MICROCIRCUITS
ANSI/ESDA/JEDEC JS-001:2017 ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing - Human Body Model (HBM) - Component Level<br>
JEDEC JEP 155B:2018 RECOMMENDED ESD TARGET LEVELS FOR HBM/MM QUALIFICATION
ANSI/ESDA/JEDEC JS-002 : 2018 ANSI/ESDA/JEDEC JOINT STANDARD FOR ELECTROSTATIC DISCHARGE SENSITIVITY TESTING – CHARGED DEVICE MODEL (CDM) – DEVICE LEVEL<br>

View more information
Sorry this product is not available in your region.

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.