ECMA 190 : 1ED 93

Section 1 - General
1 Scope
2 Conformance
3 References
4 Definitions
   4.1 case
   4.2 Clamping Zone
   4.3 Control Track
   4.4 Cyclic Redundancy Check (CRC)
   4.5 defect management
   4.6 Disk Reference Plane
   4.7 entrance surface
   4.8 Error Correction Code (ECC)
   4.9 format
   4.10 holding feature
   4.11 interleaving
   4.12 mark
   4.13 optical disk
   4.14 optical disk cartridge
   4.15 recording layer
   4.16 Reed-Solomon code
   4.17 sector
   4.18 space
   4.19 spindle
   4.20 substrate
   4.21 track
   4.22 track pitch
   4.23 WORM disk
   4.24 zone
5 Conventions
   5.1 Representation of numbers
   5.2 Names
6 Acronyms
7 General description of the optical disk cartridge
8 General requirements
   8.1 Environments
         8.1.1 Testing environment
         8.1.2 Operating environment
         8.1.3 Storage environment
         8.1.4 Transportation
   8.2 Safety requirements
   8.3 Flammability
9 Reference Drive
   9.1 Optical system
   9.2 Optical beam
   9.3 Read Channel
   9.4 Tracking
   9.5 Rotation of the disk
Section 2 - Mechanical and physical characteristics
10 Dimensional and physical characteristics of the case
   10.1 General description of the case
   10.2 Reference Planes of the case
   10.3 Dimensions of the case
         10.3.1 Overall dimensions
         10.3.2 Location Hole
         10.3.3 Alignment Hole
         10.3.4 Reference surfaces
         10.3.5 Detents
         10.3.6 Write-inhibit feature
         10.3.7 Head and spindle access windows
         10.3.8 Shutter, shutter opener and mis-insert
                 protection feature
         10.3.9 Loading grooves
         10.3.10 Sensor Holes
         10.3.11 Gripper features
         10.3.12 Label Area
   10.4 Mechanical characteristics
         10.4.1 Material
         10.4.2 Mass
         10.4.3 Distortion
         10.4.4 Compliance
         10.4.5 Shutter opening force
11 Dimensional, mechanical and physical characteristics
   of the disk
   11.1 General description of the disk
   11.2 Reference axis and plane of the disk
   11.3 Dimensions of the disk
         11.3.1 Centre Zone
         11.3.2 Clamping Zone
         11.3.3 Transition Zone
         11.3.4 Information Zone
         11.3.5 Rim Zone
   11.4 Mechanical characteristics
         11.4.1 Material
         11.4.2 Mass
         11.4.3 Moment of inertia
         11.4.4 Imbalance
         11.4.5 Axial deflection
         11.4.6 Axial acceleration
         11.4.7 Radial runout
         11.4.8 Radial acceleration
         11.4.9 Tilt
   11.5 Optical characteristics
         11.5.1 Index of refraction
         11.5.2 Thickness of the substrate
         11.5.3 Birefringence
         11.5.4 Reflectance
12 Interface between cartridge and drive
   12.1 Clamping method
   12.2 Hub
   12.3 Clamping force
   12.4 Capture cylinder
   12.5 Disk position in operating condition
Section 3 - Format of information
13 Track geometry
   13.1 Track shape
   13.2 Direction of rotation
   13.3 Track pitch
   13.4 Track number
14 Track format
   14.1 Track layout
   14.2 Radial alignment
   14.3 Sector Number
15 Sector format
   15.1 Sector layout
   15.2 VFO fields
   15.3 Address Sync (AS)
   15.4 Address Fields
   15.5 Postambles (PA)
   15.6 Mirror Field (NT)
   15.7 Gap
   15.8 Flag (FLG)
   15.9 Laser Power Test Field (LPT)
   15.10 Data Sync (DS)
   15.11 Data Field
         15.11.1 User Data bytes
         15.11.2 Address data bytes
         15.11.3 CRC and ECC bytes
         15.11.4 Resync bytes
   15.12 Buffer Field
16 Recording code
17 Format of the Information Zone
   17.1 General description of the Information Zone
   17.2 Division of the Information Zone
         17.2.1 Mirror Zone
         17.2.2 PEP Control Zone
         17.2.3 Acquire zone
         17.2.4 Test Zones
         17.2.5 SFP Control Zones
         17.2.6 Data Zone
         17.2.7 Buffer Zone
18 Format of the Data Zone
   18.1 Defect Management Areas
   18.2 Disk Structure Table (DST)
   18.3 User Zone
   18.4 WDL Zone
19 Defect management
   19.1 Media initialization
   19.2 Certification
         19.2.1 Slipping Algorithm
         19.2.2 Linear Replacement Algorithm
   19.3 Disks not certified
   19.4 Write procedure
   19.5 Primary Defect List (PDL)
   19.6 Secondary Defect List (SDL)
   19.7 Working Defect List (WDL)
Section 4 - Characteristics of embossed information
20 Method of testing
   20.1 Environment
   20.2 Use of the Reference Drive
         20.2.1 Optics and mechanics
         20.2.2 Read power
         20.2.3 Read Channels
         20.2.4 Tracking
   20.3 Definition of signals
21 Signals from grooves
   21.1 Track-cross signal
   21.2 Push-pull signal
   21.3 On-track signal
   21.4 Phase depth
   21.5 Track location
22 Signal from Headers
   22.1 VF01 and VF02
   22.2 Address Sync, Address Field and Postamble
23 Signals from embossed Recording Fields
24 Signals from PEP Control Zone
Section 5 - Characteristics of the recording layer
25 Method of testing
   25.1 Environment
   25.2 Reference Drive
         25.2.1 Optics and mechanics
         25.2.2 Read power
         25.2.3 Read Channel
         25.2.4 Tracking
   25.3 Write conditions
         25.3.1 Write pulse
   25.4 Definition of signals
26 Optical Characteristics
   26.1 Baseline reflectivity
   26.2 Uniformity of reflectivity
27 Read and write characteristics
   27.1 Sensitivity of the recording layer
         27.1.1 Optical conditions
         27.1.2 Write power and writing conditions
         27.1.3 Characteristics of the written marks
         27.1.4 Definition and measurement conditions
   27.2 Read characteristics
         27.2.1 Optical conditions
         27.2.2 Read power
         27.2.3 Reflectivity characteristics
         27.2.4 Carrier-to-noise ratio
         27.2.5 Cross-talk
         27.2.6 Timing jitter
Section 6 - Characteristics of user data
28 Method of testing
   28.1 Environment
   28.2 Reference Drive
         28.2.1 Optics and mechanics
         28.2.2 Read power
         28.2.3 Read amplifiers
         28.2.4 Analog-to-binary converters
         28.2.5 Data clock
         28.2.6 Binary-to-digital conversion
         28.2.7 Error correction
         28.2.8 Tracking
29 Minimum quality of a sector
   29.1 Address fields
   29.2 User-written data
30 Data interchange requirements
   30.1 Tracking
   30.2 User-written data
   30.3 Quality of disk
Annex A - Distortion test
Annex B - Compliance test
Annex C - Track deviation measurement
Annex D - CRD for Address Fields
Annex E - Interleave, CRC, ECC and Resync for the Data
          Fields of a sector
Annex F - PEP Control Zone
Annex G - Control parts of the SFP Zone
Annex H - Guidelines for sector replacement
Annex K - Test method for the holding characteristics of
          the disk
Annex L - Derivation of the operating climatic environment
          for the ODC
Annex M - Description of the office environment
Annex N - Transportation guidelines
Annex P - Timing jitter measurement
Annex Q - Specification of the media configuration in the
          PEP Control Zone