ECMA 260 : 1ED 97

Section 1: General
1 Scope
2 Conformance
   2.1 Optical disk cartridge
   2.2 Generating system
   2.3 Receiving system
   2.4 Compatibility statement
3 References
4 Definitions
   4.1 actual write power
   4.2 air sandwich disk
   4.3 band
   4.4 baseline reflectance
   4.5 birefringence
   4.6 case
   4.7 clamping zone
   4.8 cover sheet
   4.9 cross-talk level
   4.10 cyclic redundancy check (CRC)
   4.11 defect management
   4.12 disk reference plane
   4.13 entrance surface
   4.14 error correction code (ECC)
   4.15 error detection and correction (EDAC)
   4.16 format
   4.17 hub
   4.18 interleaving
   4.19 mark
   4.20 mark edge
   4.21 mark edge recording
   4.22 narrow band signal-to-noise ratio
   4.23 noise floor
   4.24 optical disk
   4.25 optical disk carrier
   4.26 optical disk cartridge (ODC)
   4.27 optical retardation
   4.28 perimeter ring
   4.29 pre-formatted mark
   4.30 protective layer
   4.31 read power
   4.32 recording layer
   4.33 Reed-Solomon code
   4.34 spindle
   4.35 tilt
   4.36 track
   4.37 track pitch
   4.38 write power
   4.39 zone
5 Conventions and notations
   5.1 Representation of numbers
   5.2 Names
6 List of acronyms
7 General description of the optical disk cartridge
8 General requirements
   8.1 Environments
        8.1.1 Test environment
        8.1.2 Operating environment
        8.1.3 Storage environment
        8.1.4 Transportation
   8.2 Temperature shock
   8.3 Safety requirements
   8.4 Flammability
9 Reference Drive
   9.1 Optical system
   9.2 Read conditions
   9.3 Write conditions
   9.4 Tracking
   9.5 Rotation of the disk
Section 2 - Mechanical and physical characteristics
10 Dimensional and mechanical characteristics of the
   case
   10.1 General
   10.2 Case drawings
   10.3 Relationship of sides and interface with carrier
        10.3.1 Relationship of sides
        10.3.2 Interface with carrier
        10.3.3 Write protect features
   10.4 Materials
   10.5 Mass
   10.6 Case dimensions
        10.6.1 Overall dimensions of the case
        10.6.2 Opening force of the case door
        10.6.3 Location of the case window
        10.6.4 Case write protect tabs
        10.6.5 Case autoload drive surfaces
11 Dimensional and mechanical characteristics of the
   carrier
   11.1 General
   11.2 Carrier drawings
   11.3 Sides, reference axes and reference planes
         11.3.1 Relationship between Side A and Side B
         11.3.2 Reference axes and reference features
   11.4 Materials
   11.5 Mass
   11.6 Location of the optical disk centre in the
         carrier
   11.7 Overall dimensions of the carrier
   11.8 Cutouts
   11.9 Carrier latch points and latch actuation force
   11.10 Carrier guide rails and carrier thickness
   11.11 Carrier write protect hole
   11.12 25 Gbyte capacity sensor hole
   11.13 Carrier Side A or Side B sensor hole
   11.14 Carrier disk type sensor notches
   11.15 Carrier location within the case
   11.16 Carrier locator pin slot characteristics and
         location within the case
   11.17 Carrier latch point location when the carrier
         is inside the case
   11.18 Carrier latch release hole locations
   11.19 Carrier latch release hole locations for
         unlatched carrier
   11.20 Location of carrier locator pin slots
   11.21 Carrier label location
   11.22 Carrier label
   11.23 Carrier label characteristics
12 Dimensional and physical characteristics of the disk
   12.1 General
        12.1.1 Protective layer
        12.1.2 Unobstructed access
   12.2 Disk drawings
   12.3 Sides, reference axes, reference plane
        12.3.1 Relationship of Sides A and B
        12.3.2 Reference axes and reference planes
   12.4 Dimensions of the disk
        12.4.1 Outer diameter
        12.4.2 Outer diameter of the recording zone
        12.4.3 Inner diameter of the recording zone
        12.4.4 Outer diameter of the clamping zone
        12.4.5 Inner diameter of the clamping zone
        12.4.6 Centre hole diameter of the optical
                disk
        12.4.7 Centre hole roundness
        12.4.8 Location of the recording surface
        12.4.9 Thickness of the clamping zone
        12.4.10 Inner diameter of the chamfer
        12.4.11 Inner diameter chamfer angle
        12.4.12 Outer diameter of the chamfer
        12.4.13 Chamfer angle of the outer diameter
        12.4.14 Dimensional characteristics of the
                protective layer
   12.5 Mass
   12.6 Moment of inertia
   12.7 Imbalance
   12.8 Apparent axial runout
   12.9 Residual focus error
13 Handling requirements
   13.1 Drop test
   13.2 Dead weight strength
14 Interface between disk and drive
   14.1 Clamping technique
   14.2 Radial positioning
   14.3 Reference surface
   14.4 Clamping force
15 Characteristics of the protective layer
   15.1 Index of refraction
   15.2 Thickness
   15.3 Optical characteristics
   15.4 Tilt
16 Characteristics of the recording layer
   16.1 Conformance tests
   16.2 Baseline reflectance
        16.2.1 General
        16.2.2 Actual value
        16.2.3 Requirement
   16.3 Write power requirement
   16.4 Read power requirement
   16.5 Prerecorded marks
   16.6 Data written in user area
        16.6.1 Reflectivity characteristics of written
               marks
        16.6.2 Signals
        16.6.3 Narrow-band signal-to-noise ratio
        16.6.4 Cross-talk
Section 3 - Format of information
17 General description
18 Band organization
   18.1 Number of bands on each side of the disk
   18.2 Band numbers
   18.3 Recordable area in each band
19 Track geometry in each band
   19.1 Track shape
   19.2 Direction of track spiral and disk rotation
   19.3 Track pitch
   19.4 Radial eccentricity of pre-formatted information
20 Track format
   20.1 Pre-formatted physical track in-track bit spacing
   20.2 Pre-formatted physical track layout
        20.2.1 Track layout
        20.2.2 Tracking
        20.2.3 Tracking pads
        20.2.4 Tracking pad tolerances
        20.2.5 Tracking push-pull ratio
   20.3 Rotational velocity
   20.4 Focus
   20.5 Number of sectors in each band
21 Sector format
   21.1 Organization of the sectors in each band
   21.2 Organization of the usable sectors
   21.3 User sector organization
   21.4 Lead-in and OD manufacturing test sectors
   21.5 Manufacturing control sector
   21.6 Disk identification sector(s)
   21.7 Primary Defect List sectors
   21.8 Supplemental and configuration sectors
   21.9 OD write power calibration sectors
   21.10 Automatic rewrite sectors
   21.11 User sector format for 14.8 Gbytes capacity
         21.11.1 Pre-formatted user sector header
         21.11.2 User data field preamble and pre-formatted
                 tracking pad
         21.11.3 Pre-formatted tracking pads
         21.11.4 User data field
         21.11.5 Error detection and correction (EDAC)
         21.11.6 Interface sector gap
   21.12 User sector format for 25 Gbytes capacity
         21.12.1 Pre-formatted User sector header
         21.12.2 User data field preamble
         21.12.3 Pre-formatted tracking pads
         21.12.4 User data field
         21.11.5 Error detection and correction (EDAC)
         21.12.6 Guard byte
         21.12.7 Interface sector gap
   21.13 Sectors following the user sectors in each band
         21.13.1 Allowance for the maximum number of bad
                 sectors in the PDL
         21.13.2 ID write power calibration sectors
         21.13.3 ID manufacturing test sectors
         21.13.4 Spin out tracking sectors
22 Coding method
   22.1 Coding method for 14,8 Gbyte capacity
   22.2 Coding method for 25 Gbyte capacity
23 Defect management
   23.1 Defect management description
   23.2 Initialization of the disk
   23.3 Certification
   23.4 Slipping algorithm
   23.5 Write procedure
   23.6 Primary defect list
   23.7 Secondary Defect List (SDL)
   23.8 Grown Defect List (GDL)
   23.9 Sector Retirement Guidelines
24 Recorded characteristics
25 Error detection and correction (EDAC)
   25.1 EDAC field
   25.2 EDAC type
26 Data interchange requirements
   26.1 Requirements for reading
   26.2 Requirements for writing
Annex A - Definition of air cleanliness of class 100000
Annex B - Residual tracking error signal test method
Annex C - Mechanical test method
Annex D - Imbalance test method
Annex E - Apparent axial runout test method
Annex F - Residual focus error test method
Annex G - Drop test method
Annex H - Dead weight strength test method
Annex J - Double-pass retardation test method
Annex K - Signal characteristics test method
Annex L - Optical disk write power test method
Annex M - Read power test method
Annex N - Narrow-band signal-to-noise ratio test method
Annex P - Cross-talk test method
Annex Q - Radial runout test method
Annex R - Recommendation for Transportation

Defines characteristics of 356 mm Optical Disk Cartridges (ODCs) of a kind supplying information to be written once and read many times.