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EN 168000 : 1993 AMD 2 1998

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

GENERIC SPECIFICATION - QUARTZ CRYSTAL UNITS

Superseded date

01-12-2002

Published date

12-01-2013

Foreword
Preface
SECTION 1 - Scope
SECTION 2 - General
2.1 Order of precedence
2.2 Related documents
2.3 Units, symbols and terminology
2.4 Preferred ratings and characteristics
2.5 Marking
SECTION 3 - Quality assessment procedures
3.1 Primary stage of manufacture
3.2 Structurally similar components
3.3 Subcontracting
3.4 Manufacturer's approval
3.5 Approval procedures
3.6 Procedures for capability approval
3.7 Procedures for qualification approval
3.8 Test procedures
3.9 Screening requirements
3.10 Rework and repair work
3.11 Certified test records
3.12 Delayed delivery
3.13 Release for delivery
3.14 Unchecked parameters
SECTION 4 - TEST AND MEASUREMENT PROCEDURES
4.1 General
4.2 Alternative methods
4.3 Precision of measurement
4.4 Standard conditions for testing
4.5 Visual inspection
4.6 Dimensioning and gauging procedures
4.7 Electrical test procedures
4.7.1 Frequency and resonance resistance
4.7.2 Drive level dependency
4.7.3 Frequency and resonance resistance as a function
       of temperature
4.7.4 Unwanted responses
4.7.5 Shunt capacitance
4.7.6 Load resonance frequency and resistance
4.7.7 Frequency pulling range
4.7.8 Motional parameters
4.7.9 Insulation resistance
4.8 Mechanical and environmental test procedures
4.8.1 Robustness of terminations
4.8.2 Sealing tests
4.8.3 Soldering (Solderability and resistance to solder
       heat)
4.8.4 Rapid change of temperature, two-fluid-bath method
4.8.5 Rapid change of temperature with prescribed time
       of transition
4.8.6 Bump
4.8.7 Vibration
4.8.8 Shock
4.8.9 Free fall
4.8.10 Acceleration, steady state
4.8.11 Dry heat
4.8.12 Damp heat, cyclic
4.8.13 Cold
4.8.14 Climatic sequence
4.8.15 Damp heat steady state
4.8.16 Immersion in cleaning solvents
4.9 Endurance test procedure
4.9.1 Ageing
4.9.2 Extended ageing
4.9.3 Shelf life
Annex A. Drive level dependency

Describes test methods and general requirements for quartz crystal units of assessed quality, by either capability or qualification approval procedures.

Committee
TC 49
DevelopmentNote
Supersedes CECC 68000 (08/2005)
DocumentType
Standard
PublisherName
European Committee for Standards - Electrical
Status
Superseded

CECC 00114-3 : 94 AMD 2 CAPABILITY APPROVAL OF AN ELECTRONIC COMPONENT MANUFACTURING ACTIVITY
CECC 00109 : 1974 CECC RULES OF PROCEDURE: RP 9: CERTIFIED TESTS RECORDS
IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
IEC 60068-2-27:2008 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
IEC 60068-2-20:2008 Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
IEC 60122-3:2010 Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
IEC 60068-2-21:2006 Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
IEC 60444-2:1980 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
IEC 60068-2-11:1981 Basic environmental testing procedures - Part 2-11: Tests - Test Ka: Salt mist
IEC 60027-1:1992 Letters symbols to be used in electrical technology - Part 1: General
IEC TR 60444-4:1988 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz
IEC 60410:1973 Sampling plans and procedures for inspection by attributes
IEC 60068-2-3:1969 Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state
CECC 00114-2 : 1994 RULE OF PROCEDURE 14 - QUALITY ASSESSMENT PROCEDURES - PART 2: QUALIFICATION APPROVAL OF ELECTRONIC COMPONENTS
IEC 60068-2-17:1994 Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
IEC 60068-2-2:2007 Environmental testing - Part 2-2: Tests - Test B: Dry heat
CECC 00111 : 80 AMD 3 CECC RULES OF PROCEDURE: RP 11: SPECIFICATIONS AND THEIR HARMONIZATION - COMPONENTS FOR GENERAL AND PROFESSIONAL USAGE - COMPONENTS OF ENHANCED ASSESSMENT OF QUALITY
IEC 60027-2:2005 Letter symbols to be used in electrical technology - Part 2: Telecommunications and electronics
IEC 60068-2-29:1987 Environmental testing. Part 2: Tests. Test Eb and guidance: Bump
IEC 60302:1969 Standard definitions and methods of measurement for piezoelectric vibrators operating over the frequency range up to 30 MHz
IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
IEC 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)

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