EN 300 494-3 : 1.4.1

Intellectual Property Rights
Foreword
1 Scope
2 References
3 Definitions and abbreviations
  3.1 Definitions
  3.2 Abbreviations
4 Relevant test cases list
  4.1 Network (NWK) layer
      4.1.1 Test Suite Structure (TSS)
      4.1.2 Test case index
  4.2 Data Link Control (DLC) layer
      4.2.1 Test suite structure
      4.2.2 Test case index
  4.3 Medium Access Control (MAC) layer
      4.3.1 Test Suite Structure
      4.3.2 Test case index
  4.4 PHYsical (PHY) layer
      4.4.1 Manufacturer declarations
      4.4.2 Normal Transmitted Power (NTP)
            4.4.2.1 Verdict criteria for IUTs with an
                    integral antenna
            4.4.2.2 Verdict criteria for IUTs with external
                    antenna connection(s)
      4.4.3 RFP radio receiver
      4.4.4 Void
      4.4.5 Void
5 Additional test cases list
  5.1 Test purposes
      5.1.1 NWK layer
      5.1.2 DLC layer
      5.1.3 MAC layer
      5.1.4 PHY layer
  5.2 Test cases
      5.2.1 NWK layer
      5.2.2 DLC layer
      5.2.3 MAC layer
      5.2.4 PHY layer
            5.2.4.1 Receiver sensitivity tolerance of
                    transmitter deviation variations
            5.2.4.2 Transmission of Z-field
Annex A (normative): Profile Implementation eXtra Information
        for Testing (PIXIT) proforma
      A.1 General
      A.2 Profile IXIT Requirements List (XRL)
          A.2.1 NWK layer protocol
          A.2.2 DLC layer protocol
          A.2.3 MAC layer protocol
          A.2.4 PHY layer protocol
      A.3 Profile specific IXIT
          A.3.1 NWK layer
          A.3.2 DLC layer
          A.3.3 MAC layer
          A.3.4 PHY layer
          A.3.5 Configuration constraints
      A.4 Declaration of features supported
          A.4.1 Network layer
Annex B (normative): Profile Conformance Test Report (PCTR)
        proforma
      B.1 Identification summary
          B.1.1 Profile CTR
          B.1.2 Implementation Under Test (IUT)
          B.1.3 Testing environment
          B.1.4 Limits and reservations
          B.1.5 Comments
      B.2 IUT conformance status
      B.3 Static conformance summary
      B.4 Dynamic conformance summary
      B.5 Static conformance review report
      B.6 Test campaign report
          B.6.1 NWK layer
          B.6.2 DLC layer
          B.6.3 MAC layer
          B.6.4 PHY layer
      B.7 Observations
Annex C (normative): System Conformance Test Report (SCTR)
        proforma
      C.1 Identification summary
          C.1.1 System Conformance Test Report (SCTR)
          C.1.2 Test laboratory
          C.1.3 Client
          C.1.4 System Under Test (SUT)
          C.1.5 Profile
          C.1.6 Nature of conformance testing
          C.1.7 Limits and reservations
          C.1.8 Record of agreement
          C.1.9 Comments
      C.2 System reports
          C.2.1 Profile testing summary for GAP NWK layer FT
          C.2.2 Profile testing summary for GAP DLC layer FT
          C.2.3 Profile testing summary for GAP MAC layer FT
          C.2.4 Profile testing summary for GAP PHY layer FT
Annex D (normative): System Conformance Statement (SCS)
        proforma
      D.1 Identification summary
          D.1.1 SCS identification
          D.1.2 IUT identification
          D.1.3 Client identification
          D.1.4 Supplier identification
          D.1.5 Manufacturer identification
          D.1.6 Protocols identification
          D.1.7 Profile identification
      D.2 Miscellaneous system information
          D.2.1 Configuration
          D.2.2 Other information
History

Provides the test specification for Digital Enhanced Cordless Telecommunications (DECT), Generic Access Profile (GAP) and Fixed Part (FP) applications.