EN 50324-2:2002
Current
The latest, up-to-date edition.
Piezoelectric properties of ceramic materials and components - Part 2: Methods of measurement - Low power
31-05-2002
Foreword
1 Scope
2 Symbols and units
3 Dimensions and finish of standard test specimen
4 Electrodes
5 Environmental requirements
6 Small signal data - Timing of measurement
7 Number of test specimens
8 Methods of measurement
9 Determination of a complete set of material parameters
- Systematic procedure
10 Errors in calculated coefficients
11 Determination of the temperature coefficient of the
parameters
12 Temperature coefficients of calculated parameters
13 Calculation of ageing rates
The methods of measurement described in this European Standard are for use with piezoelectric components produced from the ceramic materials described in EN 50324 1 “Terms and definitions”. Methods of measurement for specific dielectric, piezoelectric and elastic coefficients are generally applicable to piezoelectric ceramics.The polycrystalline nature of ceramics, statistical fluctuations in composition and the influence of the manufacturing process, result in specified material coefficients being typical mean values. These values are provided for design information only.Piezoelectric transducers can have widely differing shapes and may be employed in a range of vibrational modes. Material parameters however, are measured on simple test-pieces (discs, rods etc. see EN 50324-1, Figure 2) using specific geometric and electrical boundary conditions. Consequently, the results of the tests provide basic material parameters only and must only be used as a guide to the actual properties of manufactured commercial components.
Committee |
CLC/SR 49
|
DevelopmentNote |
To be read in conjunction with EN 50324-1. (10/2002)
|
DocumentType |
Standard
|
PublisherName |
European Committee for Standards - Electrical
|
Status |
Current
|
Standards | Relationship |
NF EN 50324-2 : 2002 | Identical |
NBN EN 50324-2 : 2002 | Identical |
NEN EN 50324-2 : 2002 | Identical |
I.S. EN 50324-2:2002 | Identical |
PN EN 50324-2 : 2009 | Identical |
SN EN 50324-2 : 2002 | Identical |
DIN EN 50324-2 : 2002 | Identical |
VDE 0336-2 : 2002 | Identical |
UNE-EN 50324-2:2002 | Identical |
BS EN 50324-2:2002 | Identical |
CEI EN 50324-2 : 2002 | Identical |
PNE-prEN 50324-2 | Identical |
IEC 62047-30:2017 | Semiconductor devices - Micro-electromechanical devices - Part 30: Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film |
16/30338636 DC : 0 | BS IEC 62047-30 - SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 30: MEASUREMENT METHODS OF ELECTRO-MECHANICAL CONVERSION CHARACTERISTICS OF MEMS PIEZOELECTRIC THIN FILM |
17/30309777 DC : 0 | BS ISO 19622 - FINE CERAMICS (ADVANCED CERAMICS, ADVANCED TECHNICAL CERAMICS) - TEST METHOD FOR PIEZOELECTRIC CONSTANT D[33] OF PIEZOELECTRIC CERAMICS BY DIRECT QUASI-STATIC METHOD |
BS IEC 62047-30:2017 | Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film |
ISO 19622:2018 | Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for piezoelectric constant d33 of piezoelectric ceramics by direct quasi-static method |
ISO 17859:2015 | Fine ceramics (advanced ceramics, advanced technical ceramics) Measurement method of piezoelectric strain at high electric field |
BS ISO 17859:2015 | Fine ceramics (advanced ceramics, advanced technical ceramics). Measurement method of piezoelectric strain at high electric field |
14/30265605 DC : 0 | BS ISO 17859 - FINE CERAMICS (ADVANCED CERAMICS, ADVANCED TECHNICAL CERAMICS) - MEASUREMENT METHOD OF PIEZOELECTRIC STRAIN AT HIGH ELECTRIC FIELD |
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