EN 60444-1:1997/A1:1999
Current
The latest, up-to-date edition.
MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS BY ZERO PHASE TECHNIQUE IN A PI-NETWORK - PART 1: BASIC METHOD FOR THE MEASUREMENT OF RESONANCE FREQUENCY AND RESONANCE RESISTANCE OF QUARTZ CRYSTAL UNITS BY ZERO PHASE TECHNIQUE IN A PI-NETWORK
19-10-1999
Committees responsible
National foreword
Foreword
1 Scope
2 Definition of resonance frequency
3 Reference plane and shielding box
4 Principle of measurement
5 Measuring circuit
5.1 The p-network
5.2 Accessories of the p-network
5.3 Associated equipment
6 Method of measurement
6.1 Initial calibration of the p-network
6.2 Frequency and resistance measurement
Appendix A - Additional information on accuracy
Annex B (normative) updating of some formulae of Appendix A
Figure 1
Figure 2
Figure 3 - Plot showing the phase change from the value at
25 O versus reference resistor values from 0 to
100 O AT 10 MHz, 50 MHz, 100 MHz and 200 MHz.
Measuring circuit according to, Figure 1 page 4
Figure 4 - Reference resistors and shorting blank
Figure 5a
Figure 5a
Figure A.1
Figure A.2
Figure A.3
Figure A.4
Figure A.5
Figure A.6
Figure A.7
Figure A.8 - A typical phase/frequency variation of an
adjusted p-network with a 25 O reference
resistor
Figure A.9 - Typical p-network
Figure A.10 - Detail of network assembly
Figure A.11 - Dimensions of contacting plates and earthed
shield; x indicates position of rod and disk
centers of p-network
Figure A.12 - Position of the reference resistor with
respect to the network contacting plates
Figure A.13 - Other design of a p-network
Defines a simple method for measuring resonance frequency and resonance resistance of quartz crystal units, and establishes a suitable measuring network.
Committee |
SR 49
|
DocumentType |
Standard
|
PublisherName |
European Committee for Standards - Electrical
|
Status |
Current
|
Standards | Relationship |
UNE-EN 60444-1/A1:1999 | Identical |
DIN EN 60444-1:2000-09 | Identical |
NBN EN 60444-1 : 1997 AMD 1 2000 | Identical |
BS EN 60444-1:1997 | Identical |
IEC 60444-1:1986/AMD1:1999 | Identical |
NEN EN IEC 60444-1 : 1997 AMD 1 1999 | Identical |
I.S. EN 60444-1:1999 | Identical |
PN EN 60444-1 : 2002 | Identical |
SN EN 60444-1 : 1997 AMD 1 1999 | Identical |
NF EN 60444-1 : 2000 | Identical |
EN 60444-8:2017 | Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units |
I.S. EN 60444-6:2013 | MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 6: MEASUREMENT OF DRIVE LEVEL DEPENDENCE (DLD) (IEC 60444-6:2013 (EQV)) |
EN 60444-6:2013 | Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) |
BS EN 60444-6:2013 | Measurement of quartz crystal unit parameters Measurement of drive level dependence (DLD) |
CEI EN 60122-1 : 2004 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
BS EN 60444-8:2017 | Measurement of quartz crystal unit parameters Test fixture for surface mounted quartz crystal units |
BS EN 60122-1 : 2002 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
I.S. EN 60122-1:2002 AMD 1 2018 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
CEI EN 60444-6 : 2014 | MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 6: MEASUREMENT OF DRIVE LEVEL DEPENDENCE (DLD) |
EN 60122-1:2002/A1:2018 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION (IEC 60122-1:2002/A1:2017) |
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