• EN 60444-1:1997/A1:1999

    Current The latest, up-to-date edition.

    MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS BY ZERO PHASE TECHNIQUE IN A PI-NETWORK - PART 1: BASIC METHOD FOR THE MEASUREMENT OF RESONANCE FREQUENCY AND RESONANCE RESISTANCE OF QUARTZ CRYSTAL UNITS BY ZERO PHASE TECHNIQUE IN A PI-NETWORK

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    Language(s): 

    Published date:  19-10-1999

    Publisher:  European Committee for Standards - Electrical

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    Table of Contents - (Show below) - (Hide below)

    Committees responsible
    National foreword
    Foreword
    1 Scope
    2 Definition of resonance frequency
    3 Reference plane and shielding box
    4 Principle of measurement
    5 Measuring circuit
          5.1 The p-network
          5.2 Accessories of the p-network
          5.3 Associated equipment
    6 Method of measurement
          6.1 Initial calibration of the p-network
          6.2 Frequency and resistance measurement
    Appendix A - Additional information on accuracy
    Annex B (normative) updating of some formulae of Appendix A
    Figure 1
    Figure 2
    Figure 3 - Plot showing the phase change from the value at
               25 O versus reference resistor values from 0 to
               100 O AT 10 MHz, 50 MHz, 100 MHz and 200 MHz.
               Measuring circuit according to, Figure 1 page 4
    Figure 4 - Reference resistors and shorting blank
    Figure 5a
    Figure 5a
    Figure A.1
    Figure A.2
    Figure A.3
    Figure A.4
    Figure A.5
    Figure A.6
    Figure A.7
    Figure A.8 - A typical phase/frequency variation of an
                 adjusted p-network with a 25 O reference
                 resistor
    Figure A.9 - Typical p-network
    Figure A.10 - Detail of network assembly
    Figure A.11 - Dimensions of contacting plates and earthed
                  shield; x indicates position of rod and disk
                  centers of p-network
    Figure A.12 - Position of the reference resistor with
                  respect to the network contacting plates
    Figure A.13 - Other design of a p-network

    Abstract - (Show below) - (Hide below)

    Defines a simple method for measuring resonance frequency and resonance resistance of quartz crystal units, and establishes a suitable measuring network.

    General Product Information - (Show below) - (Hide below)

    Committee SR 49
    Document Type Standard
    Publisher European Committee for Standards - Electrical
    Status Current

    Standards Referenced By This Book - (Show below) - (Hide below)

    EN 60444-8:2017 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 8: TEST FIXTURE FOR SURFACE MOUNTED QUARTZ CRYSTAL UNITS (IEC 60444-8:2016)
    I.S. EN 60444-6:2013 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 6: MEASUREMENT OF DRIVE LEVEL DEPENDENCE (DLD) (IEC 60444-6:2013 (EQV))
    EN 60444-6:2013 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 6: MEASUREMENT OF DRIVE LEVEL DEPENDENCE (DLD) (IEC 60444-6:2013)
    BS EN 60444-6:2013 (published 2013-10) Measurement of quartz crystal unit parameters Measurement of drive level dependence (DLD)
    CEI EN 60122-1 : 2004 QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    BS EN 60444-8:2017 Measurement of quartz crystal unit parameters Test fixture for surface mounted quartz crystal units
    BS EN 60122-1 : 2002 QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    I.S. EN 60122-1:2002 AMD 1 2018 QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    CEI EN 60444-6 : 2014 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 6: MEASUREMENT OF DRIVE LEVEL DEPENDENCE (DLD)
    EN 60122-1:2002/A1:2018 QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION (IEC 60122-1:2002/A1:2017)
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