EN 60679-6:2011

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and general concepts
4 Measurement method
5 Measurement and the measurement environment
6 Measurement
7 Other points to be noted
8 Miscellaneous
Annex A (normative) - Calculation method for the
        amount of phase jitter
Bibliography
Annex ZA (normative) - Normative references to international
         publications with their corresponding European
         publications

IEC 60679-6:2011 applies to the phase jitter measurement of quartz crystal oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter that allows the accurate measurement of r.m.s. jitter. In the measurement method, phase noise measurement equipment or a phase noise measurement system is used. The measuring frequency range is from 10 MHz to 1 000 MHz. This standard applies to quartz crystal oscillators and SAW oscillators used in electronic devices and modules that have the multiplication or division functions based on these oscillators. The type of phase jitter applied to these oscillators is the r.m.s. jitter. This standard cancels and replaces IEC/PAS 60679-6 published in 2008. This first edition constitutes a technical revision.