EN 60749-23:2004/A1:2011
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
Amendment of
Published date
04-03-2011
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| Committee |
CLC/TC 47X
|
| DocumentType |
Amendment
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Current
|
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