• There are no items in your cart

EN 61000-4-20:2003

Withdrawn

Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides

Withdrawn date

01-04-2006

Published date

28-04-2003

Relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. This includes open (for example, striplines and EMP simulators) and closed (for example, TEM cells) structures, which can be further classified as one-, two-, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM waveguide type. The object of this standard is to describe · TEM waveguide characteristics, including typical frequency ranges and EUT-size limitations (EUT = equipment under test); · TEM waveguide validation methods for EMC measurements; · the EUT (i.e. EUT cabinet and cabling) definition; · test set-ups, procedures, and requirements for radiated emission testing in TEM waveguides and · test set-ups, procedures, and requirements for radiated immunity testing in TEM waveguides.

Committee
CLC/TC 210
DocumentType
Standard
PublisherName
European Committee for Standards - Electrical
Status
Withdrawn

Standards Relationship
UNE-EN 61000-4-20:2004 Identical

View more information
Sorry this product is not available in your region.

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.