EN ISO 13695:2004
Current
The latest, up-to-date edition.
Optics and photonics - Lasers and laser-related equipment - Test methods for the spectral characteristics of lasers (ISO 13695:2004)
01-06-2004
Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definition
4 Symbols and abbreviated terms
5 Traceability
6 Measurement of wavelength and bandwidth
6.1 General
6.2 Types of measurements
6.3 Equipment selection
6.4 Measurements in air
6.5 Measurements at low resolution
6.6 Measurement at higher resolution
7 Measurement of wavelength stability
7.1 Dependence of the wavelength on operating conditions
7.2 Wavelength stability of a single frequency laser
8 Test report
Annex A (informative) Refractive index of air
Annex B (informative) Criteria for the choice of a grating
monochromator and its accessories - Calibration
Annex C (informative) Criteria for the choice of a Fabry-Perot
interferometer
Bibliography
ISO 13695:2004 specifies methods by which the spectral characteristics such as wavelength, bandwidth, spectral distribution and wavelength stability of a laser beam can be measured. ISO 13695:2004 is applicable to both continuous wave (cw) and pulsed laser beams. The dependence of the spectral characteristics of a laser on its operating conditions may also be important.
| Committee |
CEN/TC 123
|
| DocumentType |
Standard
|
| PublisherName |
Comite Europeen de Normalisation
|
| Status |
Current
|
| Standards | Relationship |
| BS EN ISO 13695:2004 | Identical |
| NF EN ISO 13695 : 2005 | Identical |
| SN EN ISO 13695 : 2005 | Identical |
| NEN EN ISO 13695 : 2004 | Identical |
| NBN EN ISO 13695 : 2004 | Identical |
| I.S. EN ISO 13695:2004 | Identical |
| UNI EN ISO 13695 : 2004 | Identical |
| NS EN ISO 13695 : 1ED 2004 | Identical |
| PN EN ISO 13695 : 2007 | Identical |
| UNE-EN ISO 13695:2006 | Identical |
| ISO 13695:2004 | Identical |
| DIN EN ISO 13695:2004-09 | Identical |
| IEC 60747-5-1:1997+AMD1:2001+AMD2:2002 CSV | Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General |
| ISO 12005:2003 | Lasers and laser-related equipment Test methods for laser beam parameters Polarization |
| ISO 11145:2016 | Optics and photonics Lasers and laser-related equipment Vocabulary and symbols |
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