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  • EN ISO 18452 : 2016

    Current The latest, up-to-date edition.

    FINE CERAMICS (ADVANCED CERAMICS, ADVANCED TECHNICAL CERAMICS) - DETERMINATION OF THICKNESS OF CERAMIC FILMS BY CONTACT-PROBE PROFILOMETER (ISO 18452:2005)

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    Language(s): 

    Published date:  20-04-2016

    Publisher:  Comite Europeen de Normalisation

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    Table of Contents - (Show below) - (Hide below)

    European foreword
    1 Scope
    2 Normative references
    3 Terms and definitions
    4 Principle of measurement
    5 Test environment
    6 Apparatus
    7 Test pieces
    8 Procedure
    9 Calculation
    10 Limits to step height
    11 Test report
    Annex A (informative) - Effect of amplification factor
            and levelling error on measured layer thickness

    Abstract - (Show below) - (Hide below)

    ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer.

    General Product Information - (Show below) - (Hide below)

    Committee CEN/TC 184
    Development Note Supersedes EN 1071-1. (05/2016)
    Document Type Standard
    Publisher Comite Europeen de Normalisation
    Status Current
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    ISO 3274:1996 Geometrical Product Specifications (GPS) — Surface texture: Profile method — Nominal characteristics of contact (stylus) instruments
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