EN ISO 3497:2000
Current
Current
The latest, up-to-date edition.
Metallic coatings - Measurement of coating thickness - X-ray spectrometric methods (ISO 3497:2000)
Published date
15-12-2000
Publisher
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Foreword
1 Scope
2 Terms and definitions
3 Principle
4 Apparatus
5 Factors that influence the measurement results
6 Calibration of instrument
7 Procedure
8 Measurement uncertainty
9 Test report
Annex A (informative) Typical measuring ranges for
some common coating materials
Specifies methods for measuring the thickness of metallic coatings by the use of X-ray spectrometric methods.
| Committee |
CEN/TC 262
|
| DocumentType |
Standard
|
| PublisherName |
Comite Europeen de Normalisation
|
| Status |
Current
|
| Standards | Relationship |
| ISO 3497:2000 | Identical |
| NBN EN ISO 3497 : 2001 | Identical |
| DIN EN ISO 3497:2001-12 | Identical |
| NS EN ISO 3497 : 1ED 2001 | Identical |
| I.S. EN ISO 3497:2001 | Identical |
| NEN EN ISO 3497 : 2001 | Identical |
| PN EN ISO 3497 : 2004 | Identical |
| BS EN ISO 3497:2001 | Identical |
| UNE-EN ISO 3497:2001 | Identical |
Sorry this product is not available in your region.