GEIA SSB 1.001 : 1999
Current
The latest, up-to-date edition.
QUALIFICATION AND RELIABILITY MONITORS
Hardcopy , PDF
English
01-01-1999
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1 Scope
2 Reference Documents
3 Qualification Tests
4 Monitoring Tests
Sets up the recommended minimum qualification and monitoring testing of plastic encapsulated microcircuits and discrete semiconductors suitable for potential use in many rugged, military, severe, or other environments.
| Committee |
SSTCG12
|
| DevelopmentNote |
Annex to GEIA SSB 1. (12/2005)
|
| DocumentType |
Standard
|
| Pages |
16
|
| PublisherName |
Government Electronics & Information Technology Association
|
| Status |
Current
|
| GEIA SSB 1 : 2000 | GUIDELINES FOR USING PLASTIC ENCAPSULATED MICROCIRCUITS AND SEMICONDUCTORS IN MILITARY, AEROSPACE AND OTHER RUGGED APPLICATIONS |
| DD IEC TS 62564-1 : DRAFT SEP 2011 | PROCESS MANAGEMENT FOR AVIONICS - AEROSPACE QUALIFIED ELECTRONIC COMPONENTS (AQEC) - PART 1: INTEGRATED CIRCUITS AND DISCRETE SEMICONDUCTORS |
| MIL-STD-750 Revision F:2011 | TEST METHODS FOR SEMICONDUCTOR DEVICES |
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