GEIA SSB 1.002 : 1999
Current
Current
The latest, up-to-date edition.
ENVIRONMENTAL TESTS AND ASSOCIATED FAILURE MECHANISMS
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-01-1999
€59.86
Excluding VAT
1 Scope
2 Reference Documents
3 Environmental Tests and Associated Failure
Mechanisms
Gives reference information concerning the environmental stresses associated with tests specifically designed to apply to (or have unique implications for) plastic encapsulated microcircuits and semiconductors, and the specific failures induced by these environmental stresses.
| Committee |
SSTCG12
|
| DevelopmentNote |
Annex to GEIA SSB 1. (12/2005)
|
| DocumentType |
Standard
|
| Pages |
16
|
| PublisherName |
Government Electronics & Information Technology Association
|
| Status |
Current
|
| GEIA SSB 1.004 : 2009 | FAILURE RATE ESTIMATING |
| GEIA SSB 1 : 2000 | GUIDELINES FOR USING PLASTIC ENCAPSULATED MICROCIRCUITS AND SEMICONDUCTORS IN MILITARY, AEROSPACE AND OTHER RUGGED APPLICATIONS |
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