GOST R 8-628 : 2007 AMD 1 2011
Current
Current
The latest, up-to-date edition.
STATE SYSTEM FOR ENSURING THE UNIFORMITY OF MEASUREMENTS - SINGLE-CRYSTAL SILICON NANOMETER RANGE RELIEF MEASURES - REQUIREMENTS FOR GEOMETRICAL SHAPES, LINEAR SIZES AND MANUFACTURING MATERIAL SELECTION
Published date
12-01-2013
Publisher
Sorry this product is not available in your region.
| DocumentType |
Standard
|
| PublisherName |
Interstandard (Russia)
|
| Status |
Current
|
| PD IEC/TS 62622:2012 | Nanotechnologies. Description, measurement and dimensional quality parameters of artificial gratings |
| IEC TS 62622:2012 | Nanotechnologies - Description, measurement and dimensional quality parameters of artificial gratings |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.