GOST R 8-630 : 2007 AMD 1 2011
Current
Current
The latest, up-to-date edition.
STATE SYSTEM FOR ENSURING THE UNIFORMITY OF MEASUREMENTS - ATOMIC-FORCE SCANNING PROBE MEASURING MICROSCOPES - METHODS FOR VERIFICATION
Published date
12-01-2013
Publisher
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| DocumentType |
Standard
|
| PublisherName |
Interstandard (Russia)
|
| Status |
Current
|
| PD IEC/TS 62622:2012 | Nanotechnologies. Description, measurement and dimensional quality parameters of artificial gratings |
| IEC TS 62622:2012 | Nanotechnologies - Description, measurement and dimensional quality parameters of artificial gratings |
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