I.S. EN 1071-4:2006
Current
The latest, up-to-date edition.
ADVANCED TECHNICAL CERAMICS - METHODS OF TEST FOR CERAMIC COATINGS - PART 4: DETERMINATION OF CHEMICAL COMPOSITION BY ELECTRON PROBE MICROANALYSIS (EPMA)
Hardcopy , PDF
English
01-01-2006
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Foreword
1 Scope
2 Normative references
3 Terms and definitions
3.1 General
3.2 Terms used in electron probe microanalysis
4 Principle
5 Apparatus and materials
5.1 General
5.2 Scanning electron microscope
5.3 Electron probe microanalyser
5.4 Energy dispersive spectrometer
5.5 Wavelength dispersive spectrometer
6 Preparation of test piece
6.1 General
6.2 Surface roughness
6.3 Surface conduction
7 Test procedure
7.1 General
7.2 Instrument
7.3 Analysis of thin coatings
7.4 Analysis of thick coatings
7.5 Analysis of multilayer coatings
8 Accuracy and interferences
9 Test report
Bibliography
Specifies methods for chemical analysis of ceramic coatings by means of electron probe microanalysis (EPMA) using a scanning electron microscope (SEM) or an electron probe microanalyser.
| DevelopmentNote |
Supersedes I.S. ENV 1071-4. (05/2006)
|
| DocumentType |
Standard
|
| Pages |
17
|
| PublisherName |
National Standards Authority of Ireland
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| EN 1071-4:2006 | Identical |
| NF EN 1071-4 : 2006 | Identical |
| NBN EN 1071-4 : 2006 | Identical |
| SN EN 1071-4 : 2006 | Identical |
| NEN EN 1071-4 : 2006 | Identical |
| UNI EN 1071-4 : 2006 | Identical |
| BS EN 1071-4:2006 | Identical |
| NS EN 1071-4 : 1ED 2006 | Identical |
| DIN EN 1071-4:2006-05 | Identical |
| ISO/IEC 17025:2005 | General requirements for the competence of testing and calibration laboratories |
| EN 623-4:2004 | Advanced technical ceramics - Monolithic ceramics - General and textural properties - Part 4: Determination of surface roughness |
| ISO 14594:2014 | Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy |
| ISO 15632:2012 | Microbeam analysis Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis |
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