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I.S. EN 1071-4:2006

Current

Current

The latest, up-to-date edition.

ADVANCED TECHNICAL CERAMICS - METHODS OF TEST FOR CERAMIC COATINGS - PART 4: DETERMINATION OF CHEMICAL COMPOSITION BY ELECTRON PROBE MICROANALYSIS (EPMA)

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2006

For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.

Only cited Standards give presumption of conformance to New Approach Directives/Regulations.


Dates of withdrawal of national standards are available from NSAI.

Foreword
1 Scope
2 Normative references
3 Terms and definitions
  3.1 General
  3.2 Terms used in electron probe microanalysis
4 Principle
5 Apparatus and materials
  5.1 General
  5.2 Scanning electron microscope
  5.3 Electron probe microanalyser
  5.4 Energy dispersive spectrometer
  5.5 Wavelength dispersive spectrometer
6 Preparation of test piece
  6.1 General
  6.2 Surface roughness
  6.3 Surface conduction
7 Test procedure
  7.1 General
  7.2 Instrument
  7.3 Analysis of thin coatings
  7.4 Analysis of thick coatings
  7.5 Analysis of multilayer coatings
8 Accuracy and interferences
9 Test report
Bibliography

Specifies methods for chemical analysis of ceramic coatings by means of electron probe microanalysis (EPMA) using a scanning electron microscope (SEM) or an electron probe microanalyser.

DevelopmentNote
Supersedes I.S. ENV 1071-4. (05/2006)
DocumentType
Standard
Pages
17
PublisherName
National Standards Authority of Ireland
Status
Current
Supersedes

Standards Relationship
EN 1071-4:2006 Identical
NF EN 1071-4 : 2006 Identical
NBN EN 1071-4 : 2006 Identical
SN EN 1071-4 : 2006 Identical
NEN EN 1071-4 : 2006 Identical
UNI EN 1071-4 : 2006 Identical
BS EN 1071-4:2006 Identical
NS EN 1071-4 : 1ED 2006 Identical
DIN EN 1071-4:2006-05 Identical

ISO/IEC 17025:2005 General requirements for the competence of testing and calibration laboratories
EN 623-4:2004 Advanced technical ceramics - Monolithic ceramics - General and textural properties - Part 4: Determination of surface roughness
ISO 14594:2014 Microbeam analysis Electron probe microanalysis Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
ISO 15632:2012 Microbeam analysis Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis

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