I.S. EN 2070-3:1990
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
AEROSPACE SERIES - ALUMINIUM AND ALUMINIUM ALLOY WROUGHT PRODUCTS - TECHNICAL SPECIFICATION - PART 3: BAR AND SECTION
Hardcopy , PDF
18-04-2019
English
01-01-1990
For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
Dates of withdrawal of national standards are available from NSAI.
1 Scope and field of application
2 References
3 Manufacturing
4 Batch size
5 Dimensions
6 Internal defects
7 External defects
8 Tensile test
9 Batch uniformity
10 Back end defect and peripheral coarse grain zone
11 Stress corrosion testing
12 Special tests
13 Marking
Annex A
Describes the particular requirements for bar and section in aluminium and aluminium alloys produced by extrusion, drawing or rolling. Covers references, manufacturing, batch size, dimensions, internal defects, external defects, tensile test, batch uniformity, back end defect and peripheral coarse grain zone, stress corrosion testing, special tests and marking.
DevelopmentNote |
It shall be used in conjunction with I.S. EN 2070-1. (01/2002)
|
DocumentType |
Standard
|
Pages |
22
|
PublisherName |
National Standards Authority of Ireland
|
Status |
Superseded
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SupersededBy |
Standards | Relationship |
NF EN 2070-3 : 1990 | Identical |
BS EN 2070-3:1991 | Identical |
NS EN 2070-3 : 1ED 1990 | Identical |
EN 2070-3:1989 | Identical |
DIN EN 2070-3:1990-10 | Identical |
NEN EN 2070-3 : 1989 | Identical |
UNE-EN 2070-3:1993 | Identical |
NBN EN 2070-3 : 1992 | Identical |
UNI EN 2070-3 : 1990 | Identical |
EN 2004-1:1993 | Aerospace series - Test methods for aluminium and aluminium alloy products - Part 1: Determination of electrical conductivity of wrought aluminium alloys |
EN 2002-001:2005 | Aerospace series - Metallic materials - Test methods - Part 1: Tensile testing at ambient temperature |
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