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I.S. EN 60444-2:1999

Current

Current

The latest, up-to-date edition.

MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS BY ZERO PHASE TECHNIQUE IN A PI-NETWORK - PHASE OFFSET METHOD FOR MEASUREMENT OF MOTIONAL CAPACITANCE OF QUARTZ CRYSTAL UNITS

Published date

12-01-2013

For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.

Only cited Standards give presumption of conformance to New Approach Directives/Regulations.


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Committees responsible
National foreword
Method
1 Scope
2 Principle of measurement
3 Measuring circuit
4 Method of measurement
5 Measurement errors
6 Other measuring methods
Appendix
A
Figures
1 Equivalent circuit of a quartz crystal unit
2 Measuring circuit
3 Phase and impedance characteristics of a quartz crystal
    unit in the vicinity of resonance
4 Deviation of C1 as a function of Rr for various error
    conditions
5 Deviation of C1 as a function of measured phase angle error
    and different phase angles
6 The effect of parallel capacitance CO on the measurement
    accuracy C1 versus measured phase angle
Annex ZA (normative) Normative references to international
publications with their corresponding European publications

Specifies a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%.

DevelopmentNote
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
DocumentType
Standard
PublisherName
National Standards Authority of Ireland
Status
Current

Standards Relationship
IEC 60444-2:1980 Identical
DIN EN 60444-2:1997-10 Identical
SN EN 60444-2 : 1997 Identical
BS EN 60444-2:1997 Identical
NBN EN 60444-2 : 1997 Identical
EN 60444-2:1997 Identical
NF EN 60444-2 : 2001 Identical

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