I.S. EN 60512-25-3:2001
Current
The latest, up-to-date edition.
CONNECTORS FOR ELECTRONIC EQUIPMENT - TESTS AND MEASUREMENT - PART 25-3: TEST 25C - RISE TIME DEGRADATION
Hardcopy , PDF
English
01-01-2001
For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
Dates of withdrawal of national standards are available from NSAI.
1 General
1.1 Scope and object
1.2 Definitions
2 Test resources
2.1 Equipment
2.2 Fixture
2.2.1 Method A, single-ended
2.2.2 Method B, differentially driven
3 Test specimen
3.1 Description
3.1.1 Separable connectors
3.1.2 Cable assembly
3.1.3 Sockets
4 Test procedure
4.1 Insertion technique
4.2 Reference fixture technique
4.3 Rise time degradation calculation
5 Details to be specified
6 Test documentation
Annex A (normative) - Diagrams and schematics of
fixtures and equipment
Annex B (informative) - Practical guidance
Figure 1 - Waveform
Figure A.1 - Technique diagrams
Figure A.2 - Single-ended terminations
Figure A.3 - Differential (balanced) terminations
Specifies a method for measuring the effect a specimen has on the rise time of a signal passing through it.
DevelopmentNote |
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
|
DocumentType |
Standard
|
Pages |
30
|
PublisherName |
National Standards Authority of Ireland
|
Status |
Current
|
Standards | Relationship |
UNE-EN 60512-25-3:2002 | Identical |
BS EN 60512-25-3:2001 | Identical |
DIN EN 60512-25-3:2002-08 | Identical |
NF EN 60512-25-3 : 2002 | Identical |
IEC 60512-25-3:2001 | Identical |
EN 60512-25-3:2001 | Identical |
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