• I.S. EN 60747-16-10:2004

    Current The latest, up-to-date edition.

    SEMICONDUCTOR DEVICES - PART 16-10: TECHNOLOGY APPROVAL SCHEDULE (TAS) FOR MONOLITHIC MICROWAVE INTEGRATED CIRCUITS

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  01-01-2004

    Publisher:  National Standards Authority of Ireland

    For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
    Only cited Standards give presumption of conformance to New Approach Directives/Regulations.

    Dates of withdrawal of national standards are available from NSAI.

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    Foreword to this particular Technology Approval Schedule (TAS)
    Organizations responsible for preparing the present TAS
    Preface
    INTRODUCTION
    1 General
       1.1 Scope
       1.2 Normative documents
       1.3 Units, symbols and terminology
       1.4 Standard and preferred values
       1.5 Definitions
    2 Definition of the component technology
       2.1 Scope
       2.2 Description of activities and flow charts
       2.3 Technical abstract
       2.4 Requirements for control of subcontractors
    3 Component design of MMICs
       3.1 Scope
       3.2 Description of activities and flow charts
       3.3 Interfaces
       3.4 Validations and control of the processes
    4 Mask manufacture
       4.1 Scope
       4.2 Description of activities and flow charts
       4.3 Validation and control of the processes
       4.4 Subcontractors, vendors and internal suppliers
    5 Wafer fabrication of MMICs
       5.1 Scope
       5.2 Description of activities and flow charts
       5.3 Equipment
       5.4 Materials
       5.5 Re-work
       5.6 Validation methods and control of the processes
       5.7 Interrelationship
    6 Wafer probing of MMICs
       6.1 Scope
       6.2 Description of activities and flow charts
       6.3 Equipment
       6.4 Test procedures
       6.5 Interrelationship
    7 Back-side process for bare chip delivery
       7.1 Scope
       7.2 Description of activity and flow charts
       7.3 Equipment
       7.4 Materials
       7.5 Validation methods and control of the processes
       7.6 Interrelationship
       7.7 Validity of release
    8 Assembly of MMICs
       8.1 Scope
       8.2 Description of activities and flow charts
       8.3 Materials, inspection and handling
       8.4 Equipment
       8.5 Re-work
       8.6 Validation and control of the processes
       8.7 Interrelationships
    9 Testing of MMICs
       9.1 Scope
       9.2 Description of activities and flow charts
       9.3 Equipment
       9.4 Test procedures
       9.5 Interfaces
       9.6 Validation and control of the processes
       9.7 Process boundary verification
       9.8 Product verification
    10 Process characterization
       10.1 Identification of process characteristics
       10.2 Description of activities
       10.3 Characterization procedures
    11 Packaging and shipping
       11.1 Description of activities and flow charts
       11.2 Interfaces
       11.3 Validity of release
    12 Withdrawal of Technology Approval
    Figures

    Abstract - (Show below) - (Hide below)

    Specifies the terms, definitions, symbols, quality system, test, assessment and verification methods and other requirements relevant to the design, manufacture and supply of monolithic microwave integrated circuits in compliance with the general requirements of the IECQ-CECC System for electronic components of assessed quality.

    General Product Information - (Show below) - (Hide below)

    Development Note For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
    Document Type Standard
    Publisher National Standards Authority of Ireland
    Status Current

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60191-2:2012 DB Mechanical standardization of semiconductor devices - Part 2: Dimensions
    IEC 60747-16-4:2004+AMD1:2009+AMD2:2017 CSV Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
    IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
    EN 60747-16-1:2002/A2:2017 SEMICONDUCTOR DEVICES - PART 16-1: MICROWAVE INTEGRATED CIRCUITS - AMPLIFIERS (IEC 60747-16-1:2001/A2:2017)
    IEC 60747-16-1:2001+AMD1:2007+AMD2:2017 CSV Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers
    IEC 60748-1:2002 Semiconductor devices - Integrated circuits - Part 1: General
    IEC 60747-16-3:2002+AMD1:2009+AMD2:2017 CSV Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
    IEC 60747-16-2:2001+AMD1:2007 CSV Semiconductor devices - Part 16-2: Microwave integrated circuits - Frequency prescalers
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