I.S. EN 60749-29:2011
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 29: LATCH-UP TEST
Hardcopy , PDF
English
01-01-2011
For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
Dates of withdrawal of national standards are available from NSAI.
FOREWORD
1 Scope and object
2 Terms and definitions
3 Classification and levels
4 Apparatus and material
5 Procedure
6 Failure criteria
7 Summary
Annex A (informative) - Examples of special pins
that are connected to passive components
Annex B (informative) - Calculation of operating
ambient or operating case temperature for
a given operating junction temperature
Specifies the I-test and the overvoltage latch-up testing of integrated circuits. It establishes a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria.
| DevelopmentNote |
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
|
| DocumentType |
Standard
|
| Pages |
27
|
| PublisherName |
National Standards Authority of Ireland
|
| Status |
Current
|
| Standards | Relationship |
| NF EN 60749-29 : 2012 | Identical |
| DIN EN 60749-29:2012-01 | Identical |
| NBN EN 60749-29 : 2011 | Identical |
| EN 60749-29:2011 | Identical |
| IEC 60749-29:2011 | Identical |
| BS EN 60749-29:2011 | Identical |
| UNE-EN 60749-29:2004 | Identical |
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