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I.S. EN 60749-38:2008

Current

Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 38: SOFT ERROR TEST METHOD FOR SEMICONDUCTOR DEVICES WITH MEMORY

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2008

For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.

Only cited Standards give presumption of conformance to New Approach Directives/Regulations.


Dates of withdrawal of national standards are available from NSAI.

€33.00
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FOREWORD
1 Scope
2 Terms and definitions
3 Test apparatus
4 Procedure
5 Evaluation
6 Summary
Bibliography

Describes a procedure for measuring the soft error susceptibility of semiconductor devices with memory when subjected to energetic particles such as alpha radiation.

DevelopmentNote
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
DocumentType
Standard
Pages
16
PublisherName
National Standards Authority of Ireland
Status
Current

Standards Relationship
IEC 60749-38:2008 Identical
EN 60749-38:2008 Identical

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