I.S. EN 61709:2017&AC:2019
Current
The latest, up-to-date edition.
Electric components - Reliability - Reference conditions for failure rates and stress models for conversion (IEC 61709:2017/COR1:2019)
Hardcopy , PDF
English - French
05-12-2019
For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
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FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and symbols
4 Context and conditions
5 Generic reference conditions and stress models
6 Integrated semiconductor circuits
7 Discrete semiconductors
8 Optoelectronic components
9 Capacitors
10 Resistors and resistor networks
11 Inductors, transformers and coils
12 Microwave devices
13 Other passive components
14 Electrical connections
15 Connectors and sockets
16 Relays
17 Switches and push-buttons
18 Signal and pilot lamps
19 Printed circuit boards (PCB)
20 Hybrid circuits
Annex A (normative) Failure modes of components
Annex B (informative) Thermal model for semiconductors
Annex C (informative) Failure rate prediction
Annex D (informative) Considerations on mission profile
Annex E (informative) Useful life models
Annex F (informative) Physics of failure
Annex G (informative) Considerations for the design of a data base on failure rates
Annex H (informative) Potential sources of failure rate data and methods of selection
Annex I (informative) Overview of component classification
Annex J (informative) Presentation of component reliability data
Annex K (informative) Examples
Bibliography
This document gives guidance on the use of failure rate data for reliability prediction of electric components used in equipment.
| Committee |
TC 56
|
| DocumentType |
Standard
|
| ISBN |
978-2-8322-3902-5
|
| Pages |
0
|
| ProductNote |
The date of any NSAI previous adoption may not match the date of its original CEN/CENELEC document.
|
| PublisherName |
National Standards Authority of Ireland
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| IEC 61709:2017 | Identical |
| IEC 60721-1:1990+AMD1:1992+AMD2:1995 CSV | Classification of environmental conditions - Part 1: Environmental parameters and their severities |
| IEC 62308:2006 | Equipment reliability - Reliability assessment methods |
| IEC 61812-1:2011 | Time relays for industrial and residential use - Part 1: Requirements and tests |
| IEC 60319:1999 | Presentation and specification of reliability data for electronic components |
| IEC 61360-1:2002+AMD1:2003 CSV | Standard data element types with associated classification scheme for electric components - Part 1: Definitions - Principles and methods |
| IEC 61014:2003 | Programmes for reliability growth |
| IEC 60050-151:2001 | International Electrotechnical Vocabulary (IEV) - Part 151: Electrical and magnetic devices |
| IEC 60721-3-7:1995+AMD1:1996 CSV | Classification of environmental conditions - Part 3-7: Classification of groups of environmental parameters and their severities - Portable and non-stationary use |
| IEC 60721-3-5:1997 | Classification of environmental conditions - Part 3: Classificationof groups of environmental parameters and their severities -Section 5: Ground vehicle installations |
| IEC 61508-1:1998 | Functional safety of electrical/electronic/programmable electronic safety-related systems - Part 1: General requirements (see <a>www.iec.ch/61508</a>) |
| ISO 10303-31:1994 | Industrial automation systems and integration — Product data representation and exchange — Part 31: Conformance testing methodology and framework: General concepts |
| IEC TR 60943:1998 | Guidance concerning the permissible temperature rise for parts of electrical equipment, in particular for terminals |
| IEC 61163-2:1998 | Reliability stress screening - Part 2: Electronic components |
| IEC 60721-3-4:1995 | Classification of environmental conditions - Part 3: Classification of groups of environmental parameters and their severities - Section 4: Stationary use at non-weatherprotected locations |
| IEC 60300-3-2:1993 | Dependability management - Part 3: Application guide - Section 2: Collection of dependability data from the field |
| IEC 61649:1997 | Goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data |
| IEC 60721-3-3:1994+AMD1:1995+AMD2:1996 CSV | Classification of environmental conditions - Part 3-3: Classification of groups of environmental parameters and their severities - Stationary use at weatherprotected locations |
| IEC 61360-4:1997 | Standard data element types with associated classification scheme for electric components - Part 4: IEC reference collection of standard data element types, component classes and terms |
| IEC 60050-521:2002 | International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits |
| IEC 61710:2000 | Power law model - Goodness-of-fit tests and estimation methods |
| IEC 60300-3-3:1996 | Dependability management - Part 3: Application guide - Section 3: Life cycle costing |
| IEC 60300-3-5:2001 | Dependability management - Part 3-5: Application guide - Reliability test conditions and statistical test principles |
| IEC 61703:2001 | Mathematical expressions for reliability, availability, maintainability and maintenance support terms |
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