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I.S. EN 62047-17:2015

Current

Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 17: BULGE TEST METHOD FOR MEASURING MECHANICAL PROPERTIES OF THIN FILMS

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2015

€53.00
Excluding VAT

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Only cited Standards give presumption of conformance to New Approach Directives/Regulations.


Dates of withdrawal of national standards are available from NSAI.

FOREWORD
1 Scope
2 Normative references
3 Terms, definitions and symbols
4 Principle of bulge test
5 Test apparatus and environment
6 Specimen
7 Test procedure and analysis
8 Test report
Annex A (informative) - Determination of mechanical
        properties
Annex B (informative) - Deformation measurement
        techniques
Annex C (informative) - Example of test piece fabrication:
        MEMS process
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

Defines the method for performing bulge tests on the free-standing film that is bulged within a window.

DevelopmentNote
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
DocumentType
Standard
Pages
66
PublisherName
National Standards Authority of Ireland
Status
Current

Standards Relationship
EN 62047-17:2015 Identical
DIN EN 62047-17:2015-12 Equivalent
BS EN 62047-17:2015 Equivalent

IEC 62047-2:2006 Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials
EN 62047-2:2006 Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials

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€53.00
Excluding VAT