I.S. EN 62979:2017
Current
The latest, up-to-date edition.
PHOTOVOLTAIC MODULE - BYPASS DIODE - THERMAL RUNAWAY TEST
Hardcopy , PDF
English
01-01-2017
For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
Dates of withdrawal of national standards are available from NSAI.
National Foreword
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Thermal runaway test
5 Pass or fail criteria
6 Test report
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
Defines a method for evaluating whether a bypass diode as mounted in the module is susceptible to thermal runaway or if there is sufficient cooling for it to survive the transition from forward bias operation to reverse bias operation without overheating.
DevelopmentNote |
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (11/2017)
|
DocumentType |
Standard
|
Pages |
28
|
PublisherName |
National Standards Authority of Ireland
|
Status |
Current
|
Standards | Relationship |
EN 62979:2017 | Identical |
IEC TS 61836:2007 | Solar photovoltaic energy systems - Terms, definitions and symbols |
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