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I.S. EN 62979:2017

Current

Current

The latest, up-to-date edition.

PHOTOVOLTAIC MODULE - BYPASS DIODE - THERMAL RUNAWAY TEST

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2017

For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.

Only cited Standards give presumption of conformance to New Approach Directives/Regulations.


Dates of withdrawal of national standards are available from NSAI.

€28.00
Excluding VAT

National Foreword
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Thermal runaway test
5 Pass or fail criteria
6 Test report
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

Defines a method for evaluating whether a bypass diode as mounted in the module is susceptible to thermal runaway or if there is sufficient cooling for it to survive the transition from forward bias operation to reverse bias operation without overheating.

DevelopmentNote
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (11/2017)
DocumentType
Standard
Pages
28
PublisherName
National Standards Authority of Ireland
Status
Current

Standards Relationship
EN 62979:2017 Identical

IEC TS 61836:2007 Solar photovoltaic energy systems - Terms, definitions and symbols

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