I.S. EN IEC 60749-41:2020
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices (IEC 60749-41:2020)
Hardcopy , PDF
English
21-09-2020
For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
Dates of withdrawal of national standards are available from NSAI.
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Apparatus
5 Procedure
6 Failure criteria and calculation
7 Summary
Annex A (informative) Supplementary test condition
Bibliography
This part of IEC 60749 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification.
| Committee |
TC 47
|
| DocumentType |
Test Method
|
| ISBN |
978-2-8322-8640-1
|
| Pages |
58
|
| ProductNote |
The date of any NSAI previous adoption may not match the date of its original CEN/CENELEC document. THIS STANDARD ALSO REFERS:JESD47,JESD47,JEP122H,JEDEC 22-A117
|
| PublisherName |
National Standards Authority of Ireland
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60749-41:2020 | Identical |
| EN IEC 60749-41:2020 | Identical |
| BS EN IEC 60749-41:2020 | Equivalent |
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