I.S. EN IEC 63287-1:2021
Current
The latest, up-to-date edition.
Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification (IEC 63287-1:2021)
Hardcopy , PDF
English
18-10-2021
For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
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FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Product categories and applications
5 Failure
6 Reliability test
7 Stress test methods
8 Supplementary tests
9 Summary table of assumptions
10 Summary
Bibliography
This part of IEC 63287 gives guidelines for reliability qualification plans of semiconductor integrated circuit products.
| Committee |
TC 47
|
| DocumentType |
Standard
|
| ISBN |
978-2-8322-1017-2
|
| Pages |
100
|
| ProductNote |
The date of any NSAI previous adoption may not match the date of its original CEN/CENELEC document This standard is also refers to JEITA EDR-4704A, JEITA EDR-4705, JEDEC JEP122, JEDEC JESD85, JEITA EDR-4708, AEC Q100
|
| PublisherName |
National Standards Authority of Ireland
|
| Status |
Current
|
| Standards | Relationship |
| EN IEC 63287-1:2021 | Identical |
| IEC 63287-1:2021 | Identical |
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