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    I.S. EN IEC 63287-1:2021

    Current The latest, up-to-date edition.

    Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification (IEC 63287-1:2021)

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  18-10-2021

    Publisher:  National Standards Authority of Ireland

    For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
    Only cited Standards give presumption of conformance to New Approach Directives/Regulations.

    Dates of withdrawal of national standards are available from NSAI.

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    INTRODUCTION
    1 Scope
    2 Normative references
    3 Terms and definitions
    4 Product categories and applications
    5 Failure
    6 Reliability test
    7 Stress test methods
    8 Supplementary tests
    9 Summary table of assumptions
    10 Summary
    Bibliography

    Abstract - (Show below) - (Hide below)

    This part of IEC 63287 gives guidelines for reliability qualification plans of semiconductor integrated circuit products.

    General Product Information - (Show below) - (Hide below)

    Committee TC 47
    Document Type Standard
    Product Note The date of any NSAI previous adoption may not match the date of its original CEN/CENELEC document This standard is also refers to JEITA EDR-4704A, JEITA EDR-4705, JEDEC JEP122, JEDEC JESD85, JEITA EDR-4708, AEC Q100
    Publisher National Standards Authority of Ireland
    Status Current
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