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I.S. EN ISO 14880-4:2006

Current

Current

The latest, up-to-date edition.

OPTICS AND PHOTONICS - MICROLENS ARRAYS - PART 4: TEST METHODS FOR GEOMETRICAL PROPERTIES

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2006

For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.

Only cited Standards give presumption of conformance to New Approach Directives/Regulations.


Dates of withdrawal of national standards are available from NSAI.

€64.00
Excluding VAT

Foreword
Introduction
1 Scope
2 Normative references
3 Terms, definitions and symbols
4 Coordinate system
5 Test methods
  5.1 Pitch and surface modulation depth measurement
  5.2 Physical thickness
  5.3 Radius of curvature
  5.4 Surface preparation of microlens array for measurement
6 Procedure
  6.1 Measurement of pitch and surface modulation depth
      (lens sag)
  6.2 Measurement of physical thickness
  6.3 Measurement of radius of curvature
7 Results and uncertainties
8 Test report
Annex A (normative) Measurement with a Fizeau interferometer
        system
Annex B (informative) Uniformity of array spacing
Bibliography

Specifies methods for testing geometrical properties of microlenses in microlens arrays. It is applicable to microlens arrays with very small lenses formed on one or more surfaces of a common substrate and to graded index microlenses.

DocumentType
Standard
Pages
34
PublisherName
National Standards Authority of Ireland
Status
Current

ISO 14880-2:2006 Optics and photonics — Microlens arrays — Part 2: Test methods for wavefront aberrations
ISO 4287:1997 Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions and surface texture parameters
ISO 14880-1:2016 Optics and photonics Microlens arrays Part 1: Vocabulary and general properties
ISO/TR 14999-1:2005 Optics and photonics Interferometric measurement of optical elements and optical systems Part 1: Terms, definitions and fundamental relationships
ISO 3274:1996 Geometrical Product Specifications (GPS) — Surface texture: Profile method — Nominal characteristics of contact (stylus) instruments
ISO 5436-1:2000 Geometrical Product Specifications (GPS) — Surface texture: Profile method; Measurement standards — Part 1: Material measures

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