I.S. EN ISO 5436-1:2000

Foreword
1 Scope
2 Normative references
3 Terms and definitions
4 Design requirements
    4.1 Material
    4.2 Size of measurement standard
5 Types, purposes and metrological characteristics of
    measurement standards
    5.1 General
    5.2 Type A - Depth measurement standard
    5.3 Type B - Tip condition measurement standard
    5.4 Type C - Spacing measurement standard
    5.5 Type D - Roughness measurement standard
    5.6 Type E - Profile co-ordinate measurement standard
6 Measurement standard requirements
    6.1 Type A - Depth measurement standard
    6.2 Type B - Tip condition measurement standard
    6.3 Type C - Spacing measurement standard
    6.4 Type D - Roughness measurement standard
    6.5 Type E - Profile co-ordinate measurement standard
7 Definition of the measurements for the measurement
    standards
    7.1 Type A1
    7.2 Type A2
    7.3 Type B2
    7.4 Type B3
    7.5 Types C1 to C4, and D
    7.6 Type E1
    7.7 Type E2
8 Measurement standard certificate
Annex A (informative) Relation to the GPS matrix model
Bibliography

Provides the characteristics of material measures used as measurement standards (etalons) for the calibration of metrological characteristics of instruments for the measurement of surface texture by the profile method as defined in ISO 3274.