IEC 60333:1993
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
Nuclear instrumentation - Semiconductor charged-particle detectors - Test procedures
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
31-12-2021
English - French
14-07-1993
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FOREWORD
Clause
1 Scope and object
2 Normative references
3 General requirements
4 Resolution measurements
4.1 Energy resolution
4.2 Time resolution
4.3 Position, resolution and linearity of a
position-sensitive detector
5 Noise measurement
5.1 Noise measurement by pulse-height distribution
(preferred method)
5.2 Noise measurement by oscilloscope and true
root-mean-square voltmeter
5.3 Measurement of electronic noise with the detector
removed
5.4 Determination of detector contribution to noise and
resolution
5.5 Noise linewidth (FWHM) as a function of amplifier
shaping time index
6 Sensitivity to ambient conditions
6.1 Atmospheric sensitivity
6.2 Vacuum thermal cycle test
6.3 Mechanical and environmental tests
6.4 Light sensitivity
6.5 Radiation damage measurements
7 Other measurements
7.1 Current-voltage characteristics
7.2 Dead layer energy loss
7.3 Sensitive area
7.4 Detector thickness (transmission detectors)
7.5 Capacitance-voltage characteristics
Annexes
A Symbols and glossary
B General information concerning semiconductor
charged-particle detectors
C Bibliography
Applies to semiconductor radiation detectors which are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described have been selected to be readily available to all manufacturers and users of semiconductor charged-particle detectors.
| Committee |
TC 45
|
| DocumentType |
Standard
|
| Pages |
76
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Withdrawn
|
| Supersedes |
| Standards | Relationship |
| DIN IEC 60333:1995-10 | Identical |
| NEN 10333 : 1985 | Identical |
| CEI 45-11 : 1997 | Identical |
| IEC 61151:1992 | Nuclear instrumentation - Amplifiers and preamplifiers used with detectors of ionizing radiation - Test procedures |
| IEC 62088:2001 | Nuclear instrumentation - Photodiodes for scintillation detectors - Test procedures |
| 98/718929 DC : DRAFT JAN 1999 | IEC 62088. ED. 1.0 - NUCLEAR INSTRUMENTATION - PHOTODIODES FOR SCINTILLATION DETECTORS - TEST PROCEDURES |
| IEC 60340:1974 | Test procedures for amplifiers and preamplifiers for semiconductor detectors for ionizing radiation |
| IEC 60050-391:1975 | International Electrotechnical Vocabulary (IEV) - Part 391: Detection and measurement of ionizing radiation by electric means |
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