IEC 60362:1971
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Guide for the collection of reliability, availability, and maintainability data from field performance of electronic items
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
23-07-2013
English - French
01-01-1971
Important note : Users cannot be edited or removed once added to your Multi user PDF.Provides recommendations for the collection of reliability data relating to the field performance of electronic items. It provides for the acquisition of data sufficiently comprehensive to permit detailed failure and failure-rate analysis of items operating under various conditions: time, environment, storage, stand-by, repair, etc.
| DocumentType |
Standard
|
| Pages |
21
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| UTEC 20 313 : 1981 | Identical |
| NEN NPR 10362 : 1977 | Identical |
| AS 2529-1982 | Identical |
| UNE 20512-5:1976 | Identical |
| MIL-HDBK-470 Revision A:1997 | Designing and Developing Maintainable Products and Systems, Volume I |
| IEC 61070:1991 | Compliance test procedures for steady-state availability |
| IEC 60571-3:1990 | Electronic equipment used on rail vehicles. Part 3: Components, programmable electronic equipment and electronic system reliability |
| CEI 56-32 : 2000 | COMPLIANCE TEST PROCEDURES FOR STEADY-STATE AVAILABILITY |
| IEC 60571-1:1990 | Electronic equipment used on rail vehicles. Part 1: General requirements and tests for electronic equipment |
| BS 4200-3:1979 | Guide on the reliability of electronic equipment and parts used therein Presentation of reliability data on electronic components (or parts) |
| BS QC 790101:1992 | Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits. Internal visual examination for semiconductor integrated circuits excluding hybrid circuits |
| BS CECC 23200-003:1991 | Specification for harmonized system of quality assessment for electronic components: capability detail specification: single and double sided printed boards with plated-through holes |
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