IEC 60444-11:2010
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Current
The latest, up-to-date edition.
Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
Available format(s)
Hardcopy , PDF
Language(s)
English, English - French
Published date
07-10-2010
Publisher
€82.26
Excluding VAT
IEC 60444-11:2010 defines the standard method of measuring load resonance frequency fL at the nominal value of CL, and the determination of the effective load capacitance CLeff at the nominal frequency for crystals with the figure of merit M > 4.
| Committee |
TC 49
|
| DevelopmentNote |
Stability Date: 2017. (09/2017)
|
| DocumentType |
Standard
|
| Pages |
32
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Standards | Relationship |
| NF EN 60444-11 : 2011 | Identical |
| NBN EN 60444-11 : 2011 | Identical |
| NEN EN IEC 60444-11 : 2011 | Identical |
| I.S. EN 60444-11:2010 | Identical |
| PN EN 60444-11 : 2011 | Identical |
| BS EN 60444-11:2010 | Identical |
| CEI EN 60444-11 : 2011 | Identical |
| EN 60444-11:2010 | Identical |
| DIN EN 60444-11:2011-06 | Identical |
| UNE-EN 60444-11:2010 | Identical |
| CEI EN IEC 63041-1:2022 | Piezoelectric sensors Part 1: Generic specifications |
| IEC 60444-5:1995 | Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction |
| IEC TR 60444-4:1988 | Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz |
| IEC 60122-1:2002 | Quartz crystal units of assessed quality - Part 1: Generic specification |
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