• IEC 60444-8:2016

    Current The latest, up-to-date edition.

    Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Language(s):  English, English - French

    Published date:  15-12-2016

    Publisher:  International Electrotechnical Committee

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    Abstract - (Show below) - (Hide below)

    IEC 60444-8:2016 describes test fixtures suitable for leadless surface mounted quartz crystal units in enclosures as defined in IEC 61837 (all parts). These fixtures allow the measurement of (series) resonance frequency, (series) resonance resistance, and equivalent electrical circuit parameters L1, C1 and C0 using the measurement techniques specified in IEC 60444-5 and for the determination of load resonance frequency and load resonance resistance according to IEC TR 60444-4 and IEC 60444-11.
    Two test fixtures are described in this document:
    1) A fixture using the p-network circuit with electrical values as described in IEC 60444-1 for measurements in transmission mode up to 500 MHz. This fixture includes optional means to add physical load capacitors for the measurement of load resonance parameters up to 30 MHz in accordance with IEC 60444-4. The range of load capacitance is 10 pF or more. Calibration of the measurement system and CL adapter board is explained hereinafter.
    2) A fixture based on the reflection method, suitable for a frequency range up to 1 200 MHz. No provisions for adding a physical load capacitance are anticipated. Load resonance parameters can be measured by using the method of IEC 60444-11.
    This edition includes the following significant technical changes with respect to the previous edition:
    a) modification of Clause 1;
    b) modification of 5.2;
    c) modification of 5.3;
    d) modification of 5.4;
    e) 6.3 Calibration of the reflection measurement system.

    General Product Information - (Show below) - (Hide below)

    Committee TC 49
    Development Note Supersedes IEC PAS 62277 (07/2003) Stability Date: 2017. (12/2016)
    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Current
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    I.S. EN 60444-6:2013 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 6: MEASUREMENT OF DRIVE LEVEL DEPENDENCE (DLD) (IEC 60444-6:2013 (EQV))
    EN 60444-6:2013 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
    BS EN 60444-6:2013 Measurement of quartz crystal unit parameters Measurement of drive level dependence (DLD)
    IEC 60444-6:2013 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
    CEI EN 60444-6 : 2014 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 6: MEASUREMENT OF DRIVE LEVEL DEPENDENCE (DLD)

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 61837-1:2012 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines
    IEC 60444-5:1995 Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction
    IEC 61837-2:2011+AMD1:2014 CSV Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part2: Ceramic enclosures
    IEC 60444-2:1980 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
    IEC 60444-6:2013 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
    IEC 61837-3:2015 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures
    IEC 60444-9:2007 Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units
    IEC 60444-7:2004 Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units
    IEC 60122-1:2002 Quartz crystal units of assessed quality - Part 1: Generic specification
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