IEC 60483:1976
Current
Current
The latest, up-to-date edition.
Guide to dynamic measurements of piezoelectric ceramics with high electromechanical coupling
Available format(s)
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
Language(s)
English - French, Russian
Published date
01-01-1976
Publisher
Important note : Users cannot be edited or removed once added to your Multi user PDF.Reviews admittance characteristics and equivalent circuits of ceramic resonators vibrating in simple modes. Contains methods for determining resonator parameters and material constants.
| Committee |
TC 49
|
| DevelopmentNote |
Stability Date: 2017. (09/2017)
|
| DocumentType |
Standard
|
| Pages |
35
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Standards | Relationship |
| DIN IEC 60483:1988-04 | Identical |
| BS EN 50324-1:2002 | Piezoelectric properties of ceramic materials and components Terms and definitions |
| IEC 62047-30:2017 | Semiconductor devices - Micro-electromechanical devices - Part 30: Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film |
| EN 50324-1:2002 | Piezoelectric properties of ceramic materials and components - Part 1: Terms and definitions |
| 16/30338636 DC : 0 | BS IEC 62047-30 - SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 30: MEASUREMENT METHODS OF ELECTRO-MECHANICAL CONVERSION CHARACTERISTICS OF MEMS PIEZOELECTRIC THIN FILM |
| 17/30309777 DC : 0 | BS ISO 19622 - FINE CERAMICS (ADVANCED CERAMICS, ADVANCED TECHNICAL CERAMICS) - TEST METHOD FOR PIEZOELECTRIC CONSTANT D[33] OF PIEZOELECTRIC CERAMICS BY DIRECT QUASI-STATIC METHOD |
| BS IEC 62047-30:2017 | Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film |
| NF EN 50324-1 : 2002 | PIEZOELECTRIC PROPERTIES OF CERAMIC MATERIALS AND COMPONENTS - PART 1: TERMS AND DEFINITIONS |
| ISO 19622:2018 | Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for piezoelectric constant d33 of piezoelectric ceramics by direct quasi-static method |
| ISO 17859:2015 | Fine ceramics (advanced ceramics, advanced technical ceramics) Measurement method of piezoelectric strain at high electric field |
| BS ISO 17859:2015 | Fine ceramics (advanced ceramics, advanced technical ceramics). Measurement method of piezoelectric strain at high electric field |
| 14/30265605 DC : 0 | BS ISO 17859 - FINE CERAMICS (ADVANCED CERAMICS, ADVANCED TECHNICAL CERAMICS) - MEASUREMENT METHOD OF PIEZOELECTRIC STRAIN AT HIGH ELECTRIC FIELD |
| I.S. EN 50324-1:2002 | PIEZOELECTRIC PROPERTIES OF CERAMIC MATERIALS AND COMPONENTS - PART 1: TERMS AND DEFINITIONS |
| NF EN 60917-1 : 99 AMD 1 2001 | MODULAR ORDER FOR THE DEVELOPMENT OF MECHANICAL STRUCTURES FOR ELECTRONIC EQUIPMENT PRACTICES - PART 1: GENERIC STANDARD |
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