IEC 60512-6:1984
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Electromechanical components for electronic equipment; basic testing procedures and measuring methods. Part 6: Climatic tests and soldering tests
Hardcopy , PDF
English - French
30-08-1984
04-05-2012
Contents
Foreword
Preface
Scope
Section One - Climatic Tests
Clause
1. Test 11a: Climatic sequence
2. Test 11b: Combined/sequential cold, low air pressure
and damp heat
3. Test 11c: Damp heat, steady state
4. Test 11d: Rapid change of temperature
5. Test 11e: Mould growth
6. Test 11f: Corrosion, salt mist
7. Test 11g: Corrosion, industrial atmosphere (under
consideration)
8. Test 11h: Sand and dust (under consideration)
9. Test 11i: Dry heat
10. Test 11j: Cold
11. Test 11k: Low air pressure
12. Test 11m: Damp heat, cyclic
13. Test 11n: Gas tightness, solderless wrapped connections
Section Two - Soldering Tests
14. Test 12a: Solderability, wetting, solder bath method
15. Test 12b: Solderability, wetting, iron method
16. Test 12c: Solderability, dewetting
17. Test 12d: Resistance to soldering heat, solder bath
method
18 Test 12e: Resistance to soldering heat, iron method
The tests contained in this standard, when required by the detail specification, shall be used for electromechanical components having an inherent connecting or switching function intended for use in equipment for telecommunication and in electronic devices employing similar techniques.
| Committee |
TC 48/SC 48B
|
| DevelopmentNote |
Also numbered as BS 5772-6(1984) (08/2005)
|
| DocumentType |
Standard
|
| Pages |
53
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| DIN IEC 60512-6:1994-05 | Identical |
| AS 3726.6-1989 | Identical |
| NEN 10512-6 : 1985 | Identical |
| CEI 48-12 : 1998 | Identical |
| NFC 93 400 : 85 AMD 1 88 | Identical |
| CEI 48-5 : 1ED 1983 | Identical |
| UNE 20606-6:1986 | Identical |