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  • IEC 60747-4-1:2000

    Withdrawn A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

    Semiconductor devices - Discrete devices - Part 4-1: Microwave diodes and transistors - Microwave field effect transistors - Blank detail specification

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Withdrawn date:  31-12-2021

    Language(s):  English

    Published date:  16-06-2000

    Publisher:  International Electrotechnical Committee

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    INTRODUCTION
    1 Mechanical description
    2 Short description
    3 Categories of assessed quality
    4 Limiting values (absolute maximum rating system)
       common to all applications
    5 Electrical characteristics
    6 Marking
    7 Ordering information
    8 Test conditions and inspection requirements
    9 Group D - Qualification approval tests
    10 Additional information (not for inspection purposes)
    Annex A (normative) Field-effect transistors

    Abstract - (Show below) - (Hide below)

    Defines quality assessment procedures in such a manner that electronic components that are released by one participating country as conforming with the requirements of an applicable specification are acceptable equally in all other countries that participate without need for testing further.

    General Product Information - (Show below) - (Hide below)

    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Withdrawn

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60747-8-1:1987 Semiconductor devices - Discrete devices - Part 8: Field-effecttransistors - Section One: Blank detail specification forsingle-gate field-effect transistors up to 5 W and 1 GHz
    IEC 60747-10:1991 Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits
    IEC 60191-2:2012 DB Mechanical standardization of semiconductor devices - Part 2: Dimensions
    IEC 60749:1996+AMD1:2000+AMD2:2001 CSV Semiconductor devices - Mechanical and climatic test methods
    IEC 60747-11:1985 Semiconductor devices. Discrete devices. Part 11: Sectionalspecification for discrete devices
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