11/30234042 DC : 0
|
BS EN 62595-1-1 ED.1 - LCD BACKLIGHT UNIT - PART 1-1: GENERIC SPECIFICATION |
BS CECC 265001:1998
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - TECHNOLOGY APPROVAL SCHEDULE - FILM AND HYBRID INTEGRATED CIRCUITS |
BS QC 720102:1997
|
BLANK DETAIL SPECIFICATION FOR LASER DIODE MODULES WITH PIGTAIL FOR FIBRE OPTIC SYSTEMS AND SUBSYSTEMS |
BS IEC 62679-1-1:2014 (published 2014-07)
|
Electronic paper displays Terminology |
04/30112662 DC : DRAFT APR 2004
|
IEC 61810-7 ED.2 - ELECTROMECHANICAL ELEMENTARY RELAYS - PART 7: TEST AND MEASUREMENT PROCEDURES |
BS IEC 60748-2.11 : 1999
|
SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - DIGITAL INTEGRATED CIRCUITS - BLANK DETAIL SPECIFICATION FOR SINGLE SUPPLY INTEGRATED CIRCUIT, ELECTRICALLY ERASABLE, AND PROGRAMMABLE READ-ONLY MEMORY |
03/117620 DC : DRAFT NOV 2003
|
IEC 60747-1 ED.2 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES AND INTEGRATED CIRCUITS - PART 1: GENERAL |
BS QC 750111:1991
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DISCRETE DEVICES - BLANK DETAIL SPECIFICATION - BIDIRECTIONAL TRIODE THYRISTORS (TRIACS), AMBIENT OR CASE-RATED, UP TO 100 A |
BS 6493-2.1:1985
|
Semiconductor devices. Integrated circuits General |
BS QC750116(2000) : 2000
|
SEMICONDUCTOR DEVICES - DISCRETE DEVICES - MICROWAVE DIODES AND TRANSISTORS - INTEGRATED-CIRCUIT MICROWAVE AMPLIFIERS - BLANK DETAIL SPECIFICATION |
BS EN 165000-1:1996
|
FILM AND HYBRID INTEGRATED CIRCUITS - GENERIC SPECIFICATION - PART 1: CAPABILITY APPROVAL PROCEDURE |
BS QC750100(1986) : 1986
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - DISCRETE SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION |
IEC 60300-3-7:1999
|
Dependability management - Part 3-7: Application guide - Reliability stress screening of electronic hardware |
IEC 61747-5:1998
|
Liquid crystal and solid-state display devices - Part 5: Environmental, endurance and mechanical test methods |
EN 61747-5:1998
|
Liquid crystal and solid-state display devices - Part 5: Environmental, endurance and mechanical test methods |
EN 190102:1994
|
Family Specification: TTL-Schottky digital integrated circuits - Series 54S, 64S, 74S, 84S |
EN 61643-321:2002
|
Components for low-voltage surge protective devices - Part 321: Specifications for Avalanche Breakdown Diode (ABD) |
BS CECC 90202:1990
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: INTEGRATED OPERATIONAL AMPLIFIERS |
BS EN 61751:1998
|
LASER MODULES USED FOR TELECOMMUNICATION - RELIABILITY ASSESSMENT |
BS EN 61747-5:1998
|
LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES - PART 5: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS |
11/30241341 DC : DRAFT JAN 2011
|
BS EN 62149-7 - FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - PERFORMANCE STANDARDS - PART 7: 1310 NM DISCRETE VERTICAL CAVITY SURFACE EMITTING LASER DEVICES |
BS EN 190101:1994
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - FAMILY SPECIFICATION: DIGITAL INTEGRATED TTL CIRCUITS SERIES 54, 64, 74, 84 |
12/30244653 DC : 0
|
BS EN 62679-1 - ELECTRONIC PAPER DISPLAY - PART 1:TERMINOLOGY AND GENERIC SPECIFICATION |
BS IEC 60747-4.2 : 2000
|
SEMICONDUCTOR DEVICES - DISCRETE DEVICES - MICROWAVE DIODES AND TRANSISTORS - INTEGRATED-CIRCUIT MICROWAVE AMPLIFIERS - BLANK DETAIL SPECIFICATION |
CEI EN 61643-341 : 2002
|
COMPONENTS FOR LOW-VOLTAGE SURGE PROTECTIVE DEVICES - PART 341: SPECIFICATION FOR THYRISTOR SURGE SUPPRESSOR (TSS) |
BS QC 763000(1990) : AMD 6754
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. FILM AND HYBRID FILM INTEGRATED CIRCUITS. GENERIC SPECIFICATION |
BS IEC 60300-3.7 : 1999
|
DEPENDABILITY MANAGEMENT - APPLICATION GUIDE - RELIABILITY STRESS SCREENING OF ELECTRONIC HARDWARE |
BS IEC 60748-11:2000
|
Semiconductor devices. Integrated circuits Sectional specification for semiconductor integrated circuits excluding hybrid circuits |
CEI EN 61643-321 : 2003
|
COMPONENTS FOR LOW-VOLTAGE SURGE PROTECTIVE DEVICES - PART 321: SPECIFICATIONS FOR AVALANCHE BREAKDOWN DIODE (ABD) |
CEI EN 61747-1 : 2004
|
LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES - PART 1: GENERIC SPECIFICATION |
IEC TS 61945:2000
|
Interated circuits - Manufacturing line approval - Methodology for technology and failure analysis |
IEC 61747-1-1:2014
|
Liquid crystal display devices - Part 1-1: Generic - Generic specification |
IEC 60748-2-12:2001
|
Semiconductor devices - Integrated circuits - part2-12: Digital integrated circuits - Blank detail specification for programmable logic devices (PLDs) |
IEC 60747-4-2:2000
|
Semiconductor devices - Discrete devices - Part 4-2: Microwave diodes and transistors - Integrated-circuit microwave amplifiers - Blank detail specification |
OVE/ONORM EN 61760-1 : 2006
|
SURFACE MOUNTING TECHNOLOGY - PART 1: STANDARD METHOD FOR THE SPECIFICATION OF SURFACE MOUNTING COMPONENTS (SMDS) |
BS CECC 90201:1990
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: INTEGRATED VOLTAGE REGULATORS |
I.S. EN 61751:1999
|
LASER MODULES USED FOR TELECOMMUNICATION - RELIABILITY ASSESSMENT |
07/30162213 DC : 0
|
BS EN 60747-15 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 15: ISOLATED POWER SEMICONDUCTOR DEVICES |
08/30181401 DC : DRAFT APR 2008
|
BS IEC 60747-14-1 - SEMICONDUCTOR DEVICES - PART 14-1: SEMICONDUCTOR SENSORS - GENERIC SPECIFICATION FOR SENSORS |
BS QC 790109:1992
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - FAMILY SPECIFICATION FOR HCMOS DIGITAL INTEGRATED CIRCUITS SERIES 54/74 HC, 54/74 HCT, 54/74 HCU |
BS EN 61192-4:2003
|
WORKMANSHIP REQUIREMENTS FOR SOLDERED ELECTRONIC ASSEMBLIES - PART 4: TERMINAL ASSEMBLIES |
11/30252972 DC : 0
|
BS EN 61747-10-1 - LIQUID CRYSTAL DISPLAY DEVICES - PART 10-1: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - MECHANICAL |
02/205627 DC : DRAFT APR 2002
|
IEC 60747-14-4. ED.1.0 - DISCRETE SEMICONDUCTOR DEVICES - PART 14-4: SEMICONDUCTOR ACCELEROMETERS |
BS IEC 60748-23-1:2002
|
Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification Generic specification |
05/30137514 DC : DRAFT AUG 2005
|
IEC 60747-14-4 - DISCRETE SEMICONDUCTOR DEVICES - PART 14-4: SEMICONDUCTOR ACCELEROMETERS |
BS IEC 60748-2.12 : 2001
|
SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - DIGITAL INTEGRATED CIRCUITS - BLANK DETAIL SPECIFICATION FOR PROGRAMMABLE LOGIC DEVICES (PLDS) |
BS QC790100(1991) : 1991 AMD 10586
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION FOR SEMICONDUCTOR INTEGRATED CIRCUITS EXCLUDING HYBRID CIRCUITS |
IEC 60748-23-1:2002
|
Semiconductor devices - Integrated circuits - Part 23-1: Hybrid integrated circuits and film structures - Manufacturing line certification - Generic specification |
IEC 60747-5-4:2006
|
Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers |
IEC 62679-1-1:2014
|
Electronic paper displays - Part 1-1: Terminology |
IEC 60747-10:1991
|
Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits |
I.S. EN 61747-5:1999
|
LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES - PART 5: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS |
EN 61643-341:2001
|
Components for low-voltage surge protective devices - Part 341: Specification for thyristor surge suppressors (TSS) |
09/30192488 DC : 0
|
BS EN 62595 ED.1 - MEASUREMENT METHODS OF LED BACKLIGHT UNIT FOR LIQUID CRYSTAL DISPLAYS |
12/30268616 DC : 0
|
BS EN 61747-1-1 - LIQUID CRYSTAL DISPLAY DEVICES - PART 1-1: GENERIC - GENERIC SPECIFICATION |
BS EN 61643-321:2002
|
Low voltage surge protective devices Specifications for avalanche breakdown diode (ABD) |
11/30252977 DC : 0
|
BS EN 61747-10-2 - LIQUID CRYSTAL DISPLAY DEVICES - PART 10-2: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS - ENVIRONMENTAL AND ENDURANCE |
BS EN 61643-341:2001
|
LOW VOLTAGE SURGE PROTECTIVE DEVICES - SPECIFICATION FOR THYRISTOR SURGE SUPPRESSORS (TSS) |
BS QC 720104:1997
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DEVICES - OPTOELECTRONIC DEVICES - BLANK DETAIL SPECIFICATION FOR PIN-FET MODULES WITH/WITHOUT PIGTAIL, FOR FIBRE OPTIC SYSTEMS OR SUBSYSTEMS |
BS EN 190103:1994
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - FAMILY SPECIFICATION: DIGITAL INTEGRATED TTL LOW POWER SCHOTTKY, CIRCUITS, SERIES 54LS, 64LS, 74LS, 84LS |
BS EN 190102:1994
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - FAMILY SPECIFICATION: DIGITAL INTEGRATED TTL-SCHOTTKY CIRCUITS, SERIES 54S, 64S, 74S, 84S |
17/30340372 DC : 0
|
BS EN 62906-5-1 ED 1.0 - LASER DISPLAY DEVICES - PART 5-1: MEASUREMENT OF OPTICAL PERFORMANCE FOR LASER FRONT PROJECTION |
11/30252924 DC : 0
|
BS EN 60747-5-6 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 5-6: OPTOELECTRONIC DEVICES - LIGHT EMITTING DIODES |
BS QC 790202:1991
|
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - BLANK DETAIL SPECIFICATION - MONOLITHIC INTEGRATED OPERATIONAL AMPLIFIERS |
BS EN 61747-1:2000
|
LIQUID CRYSTAL AND SOLID STATE DISPLAY DEVICES - PART 1: GENERIC SPECIFICATION |
I.S. EN 165000-1:1998
|
FILM AND HYBRID INTEGRATED CIRCUITS - PART 1: GENERIC SPECIFICATION CAPABILITY APPROVAL PROCEDURE |
I.S. EN 61192-4:2003
|
WORKMANSHIP REQUIREMENTS FOR SOLDERED ELECTRONIC ASSEMBLIES - TERMINAL ASSEMBLIES |
IEC 60748-11:1990
|
Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits |
IEC 61643-321:2001
|
Components for low-voltage surge protective devices - Part 321: Specifications for avalanche breakdown diode (ABD) |
IEC 61751:1998
|
Laser modules used for telecommunication - Reliability assessment |
IEC 61747-1:1998+AMD1:2003 CSV
|
Liquid crystal and solid-state display devices - Part 1: Generic specification |
IEC 61192-4:2002
|
Workmanship requirements for soldered electronic assemblies - Part 4: Terminal assemblies |
EN 61751:1998
|
Laser modules used for telecommunication - Reliability assessment |
09/30183239 DC : 0
|
BS EN 62572-3 - FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - RELIABILITY STANDARDS - PART 3: LASER MODULES USED FOR TELECOMMUNICATION |
DIN EN 190000:1996-05
|
GENERIC SPECIFICATION - MONOLITHIC INTEGRATED CIRCUITS |
BS QC 750000(1986) : 1986
|
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - DISCRETE SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION |
BS IEC 60747-5-4:2006
|
Semiconductor devices. Discrete devices Optoelectronic devices. Semiconductor lasers |
IEC 60747-4-1:2000
|
Semiconductor devices - Discrete devices - Part 4-1: Microwave diodes and transistors - Microwave field effect transistors - Blank detail specification |
07/30148822 DC : 0
|
BS IEC 62047-4 - SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 4: GENERIC SPECIFICATIONS FOR MEMS |
BIS IS 15934-5 : 2011
|
LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES - PART 5: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS |
CEI 56-44 : 2000
|
DEPENDABILITY MANAGEMENT - PART 3-7: APPLICATION GUIDE - RELIABILITY STRESS SCREENING OF ELECTRONIC HARDWARE |
IEC 61643-341:2001
|
Components for low-voltage surge protective devices - Part 341: Specification for thyristor surge suppressors (TSS) |
EN 61747-1:1999/A1:2003
|
LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES - PART 1: GENERIC SPECIFICATION |
EN 165000-1:1996
|
Film and hybrid integrated circuits - Part 1: Generic specification - Capability approval procedure |
EN 61192-4:2003
|
Workmanship requirements for soldered electronic assemblies - Part 4: Terminal assemblies |