• IEC 60747-5-6:2016

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Superseded date:  31-12-2021

    Language(s):  English - French

    Published date:  23-02-2016

    Publisher:  International Electrotechnical Committee

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    1 Scope
    2 Normative references
    3 Terms and definitions
    4 Absolute maximum ratings
    5 Electrical and optical characteristics
    6 Measuring method
    7 Items to be indicated on the package
    8 Quality evaluation
    Annex A (normative) - Standard luminous efficiency
    Annex B (normative) - How to obtain the self-absorption
            correction factor
    Annex C (normative) - How to obtain the colour
            correction factor
    Annex D (normative) - Calibration of the luminance
            meter
    Annex E (normative) - Colour-matching function of
            the XYZ colour system
    Annex F (normative) - Spectral chromaticity coordinates
    Annex G (normative) - Illuminometer calibration
    Bibliography

    Abstract - (Show below) - (Hide below)

    IEC 60747-5-6:2016 specifies the terminology, the essential ratings and characteristics, the measuring methods and the quality evaluations of light emitting diodes (LEDs) for general industrial applications such as signals, controllers, sensors, etc. LEDs for lighting applications are out of the scope of this part of IEC 60747. The types of LED are divided into the following five classes:
    a) LED package;
    b) LED flat illuminator;
    c) LED numeric display and alpha-numeric display;
    d) LED dot-matrix display;
    e) I LED (infrared-emitting diode).
    LEDs with a heat spreader or having a terminal geometry that performs the function of a heat spreader are within the scope of this part of IEC 60747. An integration of LEDs and controlgears, integrated LED modules, semi-integrated LED modules, integrated LED lamps or semi-integrated LED lamps, are out of the scope of this part of IEC 60747. This first edition of IEC 60747-5-6, together with IEC 60747-5-4, IEC 60747-5-5 and IEC 60747-5-7, cancels and replaces IEC 60747-5-1, IEC 60747-5-2 and IEC 60747-5-3, published in 1997, and their amendments. This edition constitutes a technical revision. This edition includes significant technical changes to the clauses for light emitting diodes in IEC 60747-5-1:1997, IEC 60747-5-2:1997 and IEC 60747-5-3:1997, including their amendments.

    General Product Information - (Show below) - (Hide below)

    Committee TC 47/SC 47E
    Development Note Supersedes IEC 60747-5-1, IEC 60747-5-2 and IEC 60747-5-3. Stability date: 2018. (02/2016)
    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Superseded
    Superseded By
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    IEC 60747-5-7:2016 Semiconductor devices - Part 5-7: Optoelectronic devices - Photodiodes and phototransistors

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60749-20:2008 Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
    IEC 60749-21:2011 Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
    IEC 60749-25:2003 Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
    IEC 60749-36:2003 Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
    IEC 60050-845:1987 International Electrotechnical Vocabulary (IEV) - Part 845: Lighting
    IEC 60749-24:2004 Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
    IEC 60749-15:2010 Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
    IEC 62504:2014 General lighting - Light emitting diode (LED) products and related equipment - Terms and definitions
    IEC 60749-6:2017 Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
    IEC 60749-10:2002 Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
    IEC 60749-14:2003 Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)
    IEC 60664-1:2007 Insulation coordination for equipment within low-voltage systems - Part 1: Principles, requirements and tests
    IEC 60749-12:2002 Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
    IEC 60068-2-30:2005 Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle)
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