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  • IEC 60747-6:2016

    Current The latest, up-to-date edition.

    Semiconductor devices - Part 6: Discrete devices - Thyristors

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Language(s):  English - French

    Published date:  13-04-2016

    Publisher:  International Electrotechnical Committee

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    Abstract - (Show below) - (Hide below)

    IEC 60747-6:2016 provides standards for the following types of discrete semiconductor devices:
    - reverse-blocking triode thyristors;
    - reverse-conducting (triode) thyristors;
    - bidirectional triodethyristors (triacs);
    - turn-off thyristors.
    This edition includes the following significant technical changes with respect to the previous edition:
    a) Clauses 3, 4, 5, 6, and 7 were amended with some deletions of information no longer in use or already included in other parts of the IEC 60747 series, and with some necessary additions;
    b) some parts of Clause 8 and Clause 9 were moved and added to Clause 7 of this third edition;
    c) Clause 8 and 9 were deleted in this third edition;
    d) Annex A was deleted.

    This publication is to be read in conjunction with IEC 60747-1:2006.

    General Product Information - (Show below) - (Hide below)

    Committee TC 47/SC 47E
    Development Note Supersedes IEC 60147-2A, IEC 60147-1C, IEC 60147-0A, IEC 60147-2H IEC 60147-2E, IEC 60147-2J and IEC 60147-1G. (07/2004) To be used in conjunction with IEC 60747-1. Stability date: 2020. (04/2016)
    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Current
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    BS EN 153000:1998 Harmonized system of quality assessment for electronic components. Generic specification: discrete pressure contact power semiconductor devices (qualification approval)
    I.S. EN 60749-34:2010 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 34: POWER CYCLING
    BS EN 60749-34:2010 Semiconductor devices. Mechanical and climatic test methods Power cycling
    CEI EN 60747-15 : 2012 SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 15: ISOLATED POWER SEMICONDUCTOR DEVICES
    IEC 60749-34:2010 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
    EN 153000:1998 Generic specification: Discrete pressure contact power semiconductor devices (Qualification approval)
    EN 60747-15:2012 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
    EN 60749-34:2010 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
    BS EN 60700-2:2016 Thyristor valves for high voltage direct current (HVDC) power transmission Terminology
    CEI EN 61643-341 : 2002 COMPONENTS FOR LOW-VOLTAGE SURGE PROTECTIVE DEVICES - PART 341: SPECIFICATION FOR THYRISTOR SURGE SUPPRESSOR (TSS)
    I.S. EN 60747-15:2012 SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 15: ISOLATED POWER SEMICONDUCTOR DEVICES (IEC 60747-15:2010 (EQV))
    BS IEC 60747-9:2007 Semiconductor devices. Discrete devices Insulated-gate bipolar transistors (IGBTs)
    DIN EN 12977-5:2016-08 (Draft) THERMAL SOLAR SYSTEMS AND COMPONENTS - CUSTOM BUILT SYSTEMS - PART 5: PERFORMANCE TEST METHODS FOR CONTROL EQUIPMENT
    I.S. EN 60700-2:2016 THYRISTOR VALVES FOR HIGH VOLTAGE DIRECT CURRENT (HVDC) POWER TRANSMISSION - PART 2: TERMINOLOGY
    IEC 60747-9:2007 Semiconductor devices - Discrete devices - Part 9: Insulated-gate bipolar transistors (IGBTs)
    I.S. EN 153000:1998 DISCRETE PRESSURE CONTACT POWER SEMICONDUCTOR DEVICES (QUALIFICATION APPROVAL) (GENERIC SPECIFICATION)
    I.S. EN 61803:1999 DETERMINATION OF POWER LOSSES IN HIGH-VOLTAGE DIRECT CURRENT (HVDC) CONVERTER STATIONS WITH LINE COMMUTATED CONVERTERS
    09/30209939 DC : 0 BS EN 60749-34 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 34: POWER CYCLING
    07/30162213 DC : 0 BS EN 60747-15 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 15: ISOLATED POWER SEMICONDUCTOR DEVICES
    BS EN 61803 : 1999 DETERMINATION OF POWER LOSSES IN HIGH-VOLTAGE DIRECT CURRENT (HVDC) CONVERTER STATIONS WITH LINE-COMMUTATED CONVERTERS (IEC 61803:1999)
    CEI EN 61803 : 2011 DETERMINATION OF POWER LOSSES IN HIGH-VOLTAGE DIRECT CURRENT (HVDC) CONVERTER STATIONS
    11/30247849 DC : 0 BS EN 12977-5 - THERMAL SOLAR SYSTEMS AND COMPONENTS - CUSTOM BUILT SYSTEMS - PART 5: PERFORMANCE TEST METHODS FOR CONTROL EQUIPMENT
    CEI EN 60749-34 : 2012 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 34: POWER CYCLING
    BS EN 60747-15:2012 Semiconductor devices. Discrete devices Isolated power semiconductor devices
    17/30343732 DC : 0 BS EN 60747-9 - SEMICONDUCTOR DEVICES - PART 9: DISCRETE DEVICES - INSULATED-GATE BIPOLAR TRANSISTORS (IGBTS)
    17/30357121 DC : 0 PD IEC/TS 60076-23 ED.1.0 - POWER TRANSFORMERS - PART 23: SUPPRESSION DEVICES OF DC MAGNETIC BIAS OF ELECTRIC POWER TRANSFORMERS
    BS EN 60633 : 1999 TERMINOLOGY FOR HIGH-VOLTAGE DIRECT CURRENT (HVDC) TRANSMISSION
    UNI EN 12977-5 : 2012 THERMAL SOLAR SYSTEMS AND COMPONENTS - CUSTOM BUILT SYSTEMS - PART 5: PERFORMANCE TEST METHODS FOR CONTROL EQUIPMENT
    NF EN 61803 : 2000 AMD 2 2017 DETERMINATION OF POWER LOSSES IN HIGH-VOLTAGE DIRECT CURRENT (HVDC) CONVERTER STATIONS WITH LINE-COMMUTATED CONVERTERS
    IEC 60633:1998+AMD1:2009+AMD2:2015 CSV Terminology for high-voltage direct current (HVDC) transmission
    EN 61643-341:2001 Components for low-voltage surge protective devices - Part 341: Specification for thyristor surge suppressors (TSS)
    DIN VDE 0558-1 : 1987 SEMICONDUCTOR CONVERTORS - GENERAL SPECIFICATIONS AND PARTICULAR SPECIFICATIONS FOR LINE-COMMUTATED CONVERTORS
    14/30281809 DC : 0 BS EN 60700-2 - THYRISTOR VALVES FOR HIGH-VOLTAGE DIRECT CURRENT (HVDC) POWER TRANSMISSION - PART 2: TERMINOLOGY
    BS EN 61643-341:2001 Low voltage surge protective devices Specification for thyristor surge suppressors (TSS)
    04/30114936 DC : DRAFT JUN 2004 EN 50439 - RAILWAY APPLICATIONS - RELIABILITY TESTS FOR HIGH POWER SEMICONDUCTORS DEVICES - PART 1: STANDARD BASE-PLATE MODULES
    09/30206330 DC : 0 BS EN 61803:1999+A1 - DETERMINATION OF POWER LOSSES IN HIGH-VOLTAGE DIRECT CURRENT (HVDC) CONVERTER STATIONS
    BS EN 12977-5:2012 Thermal solar systems and components. Custom built systems Performance test methods for control equipment
    EN 12977-5:2018 Thermal solar systems and components - Custom built systems - Part 5: Performance test methods for control equipment
    EN 60700-2:2016/AC:2017-07 THYRISTOR VALVES FOR HIGH VOLTAGE DIRECT CURRENT (HVDC) POWER TRANSMISSION - PART 2: TERMINOLOGY (IEC 60700-2:2016/COR1:2017)
    EN 61803:1999/A2:2016 DETERMINATION OF POWER LOSSES IN HIGH-VOLTAGE DIRECT CURRENT (HVDC) CONVERTER STATIONS WITH LINE COMMUTATED CONVERTERS (IEC 61803:1999/A2:2016)
    IEC 61747-1:1998+AMD1:2003 CSV Liquid crystal and solid-state display devices - Part 1: Generic specification
    UNE-EN 60749-34:2011 Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling
    IEC 61803:1999+AMD1:2010+AMD2:2016 CSV Determination of power losses in high-voltage direct current (HVDC)converter stations with line-commutated converters
    I.S. EN 12977-5:2012 THERMAL SOLAR SYSTEMS AND COMPONENTS - CUSTOM BUILT SYSTEMS - PART 5: PERFORMANCE TEST METHODS FOR CONTROL EQUIPMENT
    BS QC 750000(1986) : 1986 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - DISCRETE SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION
    I.S. EN 60633:1999 TERMINOLOGY FOR HIGH-VOLTAGE DIRECT CURRENT (HVDC) TRANSMISSION
    EN 60633:1999/A2:2015 TERMINOLOGY FOR HIGH-VOLTAGE DIRECT CURRENT (HVDC) TRANSMISSION (IEC 60633:1998/A2:2015)
    IEC 61643-341:2001 Components for low-voltage surge protective devices - Part 341: Specification for thyristor surge suppressors (TSS)
    IEC 60747-15:2010 Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
    DIN EN 12977-5:2012-06 THERMAL SOLAR SYSTEMS AND COMPONENTS - CUSTOM BUILT SYSTEMS - PART 5: PERFORMANCE TEST METHODS FOR CONTROL EQUIPMENT

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60749-25:2003 Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
    IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
    IEC 60749-34:2010 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
    IEC 60050-521:2002 International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits
    IEC 60050-113:2011 International Electrotechnical Vocabulary (IEV) - Part 113: Physics for electrotechnology
    IEC 60749-23:2004+AMD1:2011 CSV Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
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