IEC 60749-12:2017
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English - French
13-12-2017
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FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Test method
6 Examination and test measurements
7 Failure criteria
8 Summary
Bibliography
IEC 60749-12:2017 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages
This second edition cancels and replaces the first edition published in 2002. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
a) alignment with MIL-STD-883J Method 2007, Vibration, variable frequency.
| Committee |
TC 47
|
| DevelopmentNote |
Supersedes IEC PAS 62187 (08/2002) Supersedes IEC 60749. (03/2008) Stability Date: 2024. (12/2017)
|
| DocumentType |
Standard
|
| Pages |
14
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| CEI EN IEC 60749-12:2018 | Identical |
| UNE-EN IEC 60749-12:2018 | Identical |
| BS EN IEC 60749-12:2018 | Identical |
| MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
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